WM2632
Production Data
ELECTRICAL CHARACTERISTICS
Test Characteristics:
RL = 10kΩ, CL = 100pF AVDD = DVDD = 5V ± 10%, VREF = 2.048V and AVDD = DVDD = 3V ± 10%, VREF = 1.024V over
recommended operating free-air temperature range (unless noted otherwise).
TEST
PARAMETER
SYMBOL
MIN
TYP
MAX
UNIT
CONDITIONS
Static DAC Specifications
Resolution
8
bits
LSB
Integral non-linearity
Differential non-linearity
Zero code error
INL
DNL
ZCE
GE
Code 6 to 255 (see Note 1)
Code 6 to 255 (see Note 2)
See Note 3
±0.3
±0.1
±1
±1
LSB
±30
±0.6
mV
Gain error
See Note 4
% FSR
dB
DC power supply rejection ratio
PSRR
See Note 5
-50
30
Zero code error temperature
coefficient
See Note 6
µV/°C
Gain error temperature coefficient
DAC Output Specifications
Output voltage range
See Note 6
10
ppm/°C
10kΩ Load
0
AVDD-0.4
±0.3
V
Output load regulation
2kΩ to 10kΩ load
% Full
Scale
See Note 7
Power Supplies
Active supply current
IDD
No load, VIH=DVDD, VIL=0V
AVDD = DVDD = 5V,
V
REF = 2.048V
Slow
6
8
mA
mA
Fast
16
21
See Note 8
Power down supply current
No load, all inputs 0V
or DVDD
0.1
µA
Dynamic DAC Specifications
Slew rate
DAC code 10%-90%
Load = 10kΩ, 100pF
Fast
4
1
10
3
V/µs
V/µs
Slow
See Note 9
Settling time
DAC code 10%-90%
Load = 10kΩ, 100pF
Fast
1
3
3
7
µs
µs
Slow
See Note 10
DAC code 127 to 128
Glitch energy
4
nV-s
dB
Channel Crosstalk
10kHz sine wave, 4V pk-pk
-90
WOLFSON MICROELECTRONICS LTD
PD Rev 1.1 April 2001
4