WM2604
Production Data
ABSOLUTE MAXIMUM RATINGS
Absolute Maximum Ratings are stress ratings only. Permanent damage to the device may be caused by continuously operating at or
beyond these limits. Device functional operating limits and guaranteed performance specifications are given under Electrical
Characteristics at the test conditions specified
ESD Sensitive Device. This device is manufactured on a CMOS process. It is therefore generically susceptible to
damage from excessive static voltages. Proper ESD precautions must be taken during handling and storage of this
device.
CONDITION
MIN
MAX
7V
Supply voltages, AVDD to AGND, DVDD to DGND
Supply voltage differences, AVDD to DVDD
Digital input voltage
-2.8V
-0.3V
-0.3V
2.8V
DVDD + 0.3V
AVDD + 0.3V
Reference input voltage
Operating temperature range, TA
WM2604C
WM2604I
0°C
70°C
85°C
-40°C
-65°C
Storage temperature
150°C
Lead temperature 1.6mm (1/16 inch) soldering for 10 seconds
260°C
RECOMMENDED OPERATING CONDITIONS
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
2.7
2
TYP
MAX
UNIT
Supply voltage
AVDD, DVDD
5.5
V
V
V
V
High-level digital input voltage
Low-level digital input voltage
VIH
VIL
DVDD = 2.7V to 5.5V
DVDD = 2.7V to 5.5V
See Note
0.8
Reference voltage to REFINAB,
REFINCD
VREF
AVDD - 1.5
Load resistance
RL
CL
2
10
kW
Load capacitance
100
20
pF
Serial clock rate
fSCLK
TA
MHz
Operating free-air temperature
WM2604CDT
WM2604IDT
0
70
85
°C
°C
-40
Note: Reference voltages greater than AVDD/2 will cause output saturation for large DAC codes.
WOLFSON MICROELECTRONICS LTD
PD Rev 1.0 June 99
3
WOLFSON [ WOLFSON MICROELECTRONICS PLC ]
