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WM2152
ABSOLUTE MAXIMUM RATINGS
Absolute Maximum Ratings are stress ratings only. Permanent damage to the device may be caused by continuously operating at
or beyond these limits. Device functional operating limits and guaranteed performance specifications are given under Electrical
Characteristics at the test conditions specified.
ESD Sensitive Device. This device is manufactured on a CMOS process. It is therefore generically susceptible
to damage from excessive static voltages. Proper ESD precautions must be taken during handling and storage
of this device.
CONDITION
MIN
-0.3V
MAX
+4.0V
Digital supply voltage, DVDD to DGND
Input clock supply voltage, CLKVDD to CLKGND
Analogue supply voltage, AVDD to AGND
Maximum ground difference between AGND, DGND and CLKGND
Voltage range digital inputs
-0.3V
+4.0V
-0.3V
+4.0V
-0.3V
+0.3V
DGND - 0.3V
AGND - 0.3V
CLKGND - 0.3V
-40°C
DVDD + 0.3V
AVDD + 0.3V
CLKVDD + 0.3V
+150°C
Voltage range analogue inputs
Voltage range CLK input
Operating junction temperature range, TJ
Storage temperature
-65°C
+150°C
Lead temperature (1.6mm from package body for 10 seconds)
+300°C
WOLFSON MICROELECTRONICS LTD
PP Rev 1.1 March 2001
3
WOLFSON [ WOLFSON MICROELECTRONICS PLC ]
