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W90N745CDG 参数 Datasheet PDF下载

W90N745CDG图片预览
型号: W90N745CDG
PDF下载: 下载PDF文件 查看货源
内容描述: 16位/ 32位ARM微控制器 [16/32-bit ARM microcontroller]
分类和应用: 微控制器和处理器外围集成电路时钟
文件页数/大小: 422 页 / 2455 K
品牌: WINBOND [ WINBOND ]
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W90N745CD/W90N745CDG  
BITS  
DESCRIPTIONS  
[31:5]  
Reserved  
BistFail  
-
The BIST Fail indicates if the BIST test fails or succeeds. If the  
BistFail is low at the end, the embedded SRAM pass the BIST test,  
otherwise, it is faulty. The BistFail will be high once the BIST  
detects the error and remains high during the BIST operation. If  
BistFail[2] high indicates the embedded SRAM for TxFIFO BIST  
test failed. If BistFail[3] high indicates the embedded SRAM for  
RxFIFO BIST test failed.  
[3:2]  
The BistFail is a write clear field. Write 1 to this field clears the  
content and write 0 has no effect.  
The BIST Operation Finish indicates the end of the BIST  
operation. When BIST controller finishes all operations, this bit will  
be high.  
[1]  
[0]  
Finish  
BMEn  
The Finish is a write clear field. Write 1 to this field clears the  
content and write 0 has no effect.  
The BIST Mode Enable is used to enable the BIST operation. If  
high enables the BIST controller to do embedded SRAM test. This  
bit is also used to do the reset for BIST circuit. It is necessary to  
reset the BIST circuit one clock cycle at least in order to initialize  
the BIST properly.  
The BMEn can be disabled by write 0.  
Publication Release Date: September 22, 2006  
- 157 -  
Revision A2  
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