WMF2M8-XXX5
White Electronic Designs
AC CHARACTERISTICS – WRITE/ERASE/PROGRAM OPERATIONS,CS# CONTROLLED
VCC = 5.0V, VSS = 0V, VSS = 0V, -55°C ≤ TA ≤ +125°C
Parameter
Symbol
-90
-120
-150
Unit
Min
90
0
Max
Min
120
0
Max
Min
150
0
Max
Write Cycle Time
tAVAV
tWLEL
tELEH
tWC
tWS
tCP
ns
ns
Write Enable Setup Time
Chip Select Pulse Width
Address Setup Time
45
0
50
0
50
0
ns
tAVEL
tAS
ns
Data Setup Time
tDVEH
tEHDX
tELAX
tDS
45
0
50
0
50
0
ns
Data Hold Time
tDH
tAH
ns
Address Hold Time
45
20
50
20
50
20
ns
Chip Select Pulse Width High
Duration of Byte Programming Operation (1)
Sector Erase Time (2)
Read Recovery Time
tEHEL
tCPH
ns
tWHWH1
tWHWH2
tGHEL
300
15
300
15
300
15
μs
sec
μs
sec
sec
ns
0
0
0
Chip Programming Time
Chip Erase Time (3)
44
44
44
256
256
256
Output Enable Hold Time (4)
tOEH
10
10
10
NOTES:
1. Typical value for tWHWH1 is 7μs.
2. Typical value for tWHWH2 is 1sec.
3. Typical value for Chip Erase Time is 32sec.
4. For Toggle and Data Polling.
FIGURE 2 – AC TEST CIRCUIT
AC Test Conditions
Parameter
Typ
Unit
V
IOL
Current Source
Input Pulse Levels
Input Rise and Fall
VIL = 0, VIH = 3.0
5
ns
V
Input and Output Reference Level
1.5
1.5
VZ = 1.5V
(Bipolar Supply)
Output Timing Reference Level
V
D.U.T.
Ceff = 50 pf
Notes:
VZ is programmable from -2V to +7V.
IOL & IOH programmable from 0 to 16mA.
Tester Impedance Z0 = 75 Ω.
VZ is typically the midpoint of VOH and VOL
IOL & IOH are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
.
IOL
Current Source
HARDWARE RESET (RESET#)
Parameter
Std
tREADY
tREADY
tRP
Description
Test Setup
Max
All Speed Options
Unit
RESET Pin Low (During Embedded Algorithms) to Read or Write (See Note)
RESET Pin Low (Not During Embedded Algorithms) to Read or Write (See Note)
RESET Pulse Width
20
500
500
50
μs
ns
ns
ns
ns
Max
Min
tRH
RESET High Time Before Read (See Note)
Min
tRB
RY/BY Recovery Time
Min
0
May 2004
Rev. 6
4
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com
WEDC [ WHITE ELECTRONIC DESIGNS CORPORATION ]
