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5962-9669109HZX 参数 Datasheet PDF下载

5962-9669109HZX图片预览
型号: 5962-9669109HZX
PDF下载: 下载PDF文件 查看货源
内容描述: [Standard SRAM, 128KX8, 20ns, CMOS, CDSO36, CERAMIC, SOJ-36]
分类和应用: 静态存储器内存集成电路
文件页数/大小: 10 页 / 208 K
品牌: WEDC [ WHITE ELECTRONIC DESIGNS CORPORATION ]
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WMS128K8-XXX
AC CHARACTERISTICS
(V
CC
= 5.0V, GND = 0V, T
A
= -55°C to +125°C)
Parameter
Read Cycle
Read Cycle Time
Address Access Time
Output Hold from Address Change
Chip Select Access Time
Output Enable to Output Valid
Chip Select to Output in Low Z
Output Enable to Output in Low Z
Chip Disable to Output in High Z
Output Disable to Output in High Z
t
RC
t
AA
t
OH
t
ACS
t
OE
t
CLZ
t
OLZ
t
CHZ
1
Symbol
-15
Min
15
15
0
15
10
3
0
10
10
3
0
0
Max
-17
Min
17
17
0
17
10
3
0
10
10
Max Min
20
-20
Max
Min
25
20
0
20
12
3
0
10
10
-25
Max
Min
35
25
0
25
15
3
0
12
12
-35
Max
Min
45
35
0
35
20
3
0
20
20
-45
Max
-55
Min
55
45
0
45
25
3
0
20
20
20
20
55
30
55
Max
Units
ns
ns
ns
ns
ns
ns
ns
ns
ns
1
1
t
OHZ
1
1. This parameter is guaranteed by design but not tested.
AC CHARACTERISTICS
(V
CC
= 5.0V, GND = 0V, T
A
= -55°C to +125°C)
Parameter
Write Cycle
Write Cycle Time
Chip Select to End of Write
Address Valid to End of Write
Data Valid to End of Write
Write Pulse Width
Address Setup Time
Address Hold Time
Output Active from End of Write
Write Enable to Output in High Z
Data Hold Time
t
WC
t
CW
t
AW
t
DW
t
WP
t
AS
t
AH
t
OW
1
Symbol
Min
15
14
14
10
14
0
0
3
-15
Max
17
14
15
10
14
0
0
3
10
0
0
-17
Min Max
Min
20
15
15
12
15
0
0
3
10
0
-20
Max
Min
25
20
20
15
20
0
0
3
12
0
-25
Max
35
25
25
20
25
0
0
4
15
0
-35
Min
Max
Min
45
30
30
25
30
0
0
4
20
0
-45
Max
Min
55
45
45
25
45
0
0
4
25
0
-55
Max
Units
ns
ns
ns
ns
ns
ns
ns
ns
25
ns
ns
t
WHZ
t
DH
1
1. This parameter is guaranteed by design but not tested.
AC TEST CIRCUIT
I
OL
Current Source
AC TEST CONDITIONS
Parameter
Input Pulse Levels
Input Rise and Fall
Input and Output Reference Level
Typ
V
IL
= 0, V
IH
= 3.0
5
1.5
1.5
Unit
V
ns
V
V
D.U.T.
C
eff
= 50 pf
V
Z
1.5V
Output Timing Reference Level
(Bipolar Supply)
I
OH
Current Source
NOTES:
V
Z
is programmable from -2V to +7V.
I
OL
& I
OH
programmable from 0 to 16mA.
Tester Impedance Z
0
= 75
Ω.
V
Z
is typically the midpoint of V
OH
and V
OL
.
I
OL
& I
OH
are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
3
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com