TABLE I. Electrical performance characteristics - Continued.
Test
Symbol
Conditions 1/ 2/
-55°C ≤ TC ≤ +125°C
Group A
subgroups
Device
types
Limits
Unit
Min
2.0
Max
5.5
V
SS = 0 V dc
+4.5 V dc ≤ VCC ≤ +5.5 V dc
unless otherwise specified
Data retention characteristics
Data retention supply
voltage
VDR
01-10
V
CS ≥ VCC - 0.2 V dc
1,2,3
1,2,3
Data retention current
ICCDR1
VCC = 3 V dc
01-04
05-10
1.6
28
mA
32
19,20
Capacitance
COE
CWE
CCS
CI/O
CAD
VIN = 0 V dc, f = 1.0 MHz,
TA = +25°C
4
4
4
4
4
All
All
All
All
All
50
20
20
20
50
pF
pF
pF
pF
pF
OE capacitance 4/
VOUT = 0 V dc, f = 1.0 MHz,
TA = +25°C
WE 1-4 capacitance 4/
CS capacitance 4/
VIN = 0 V dc, f = 1.0 MHz,
TA = +25°C
D0-31 capacitance 4/
VOUT = 0 V dc, f = 1.0 MHz,
TA = +25°C
A0-16 capacitance 4/
VOUT = 0 V dc, f = 1.0 MHz,
TA = +25°C
Functional tests
Functional tests
See 4.3.1c
7,8A,8B
9,10,11
All
Read cycle timing characteristics
Read cycle timing
tRC
See figure 4
01
120
100
85
70
55
45
35
25
20
17
15
12
ns
02
03
04
05,11
06,12
07,13
08,14
09,15
10,16
17,19
18,20
See footnotes at end of table.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-94611
A
REVISION LEVEL
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
7
R
DSCC FORM 2234
APR 97
WEDC [ WHITE ELECTRONIC DESIGNS CORPORATION ]
