欢迎访问ic37.com |
会员登录 免费注册
发布采购

5962-9461108HXC 参数 Datasheet PDF下载

5962-9461108HXC图片预览
型号: 5962-9461108HXC
PDF下载: 下载PDF文件 查看货源
内容描述: [Cache SRAM Module, 512KX32, 25ns, CMOS, CPGA66, HEX-IN-LINE, SINGLE CAVITY, WITH STANDOFFS-66]
分类和应用: 静态存储器
文件页数/大小: 40 页 / 287 K
品牌: WEDC [ WHITE ELECTRONIC DESIGNS CORPORATION ]
 浏览型号5962-9461108HXC的Datasheet PDF文件第26页浏览型号5962-9461108HXC的Datasheet PDF文件第27页浏览型号5962-9461108HXC的Datasheet PDF文件第28页浏览型号5962-9461108HXC的Datasheet PDF文件第29页浏览型号5962-9461108HXC的Datasheet PDF文件第31页浏览型号5962-9461108HXC的Datasheet PDF文件第32页浏览型号5962-9461108HXC的Datasheet PDF文件第33页浏览型号5962-9461108HXC的Datasheet PDF文件第34页  
TABLE II. Electrical test requirements.  
MIL-PRF-38534 test requirements  
Subgroups  
(in accordance with  
MIL-PRF-38534, group  
A test table)  
Interim electrical parameters  
Final electrical parameters  
Group A test requirements  
1,4,7,9  
1*,2,3,4,7,8A,8B,9,10,11  
1,2,3,4,7,8A,8B,9,10,11  
1,2,3,4,7,8A,8B,9,10,11  
Not applicable.  
Group C end-point electrical  
Parameters  
End-point electrical parameters  
for Radiation Hardness Assurance  
(RHA) devices  
* PDA applies to subgroup 1.  
4. VERIFICATION  
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as  
modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the  
form, fit, or function as described herein.  
4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply:  
a. Burn-in test, method 1015 of MIL-STD-883.  
(1) Test condition B. The test circuit shall be maintained by the manufacturer under document revision level control  
and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall  
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in  
method 1015 of MIL-STD-883.  
(2) TA as specified in accordance with table I of method 1015 of MIL-STD-883.  
b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter  
tests prior to burn-in are optional at the discretion of the manufacturer.  
4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance  
with MIL-PRF-38534 and as specified herein.  
4.3.1 Group A inspection (CI). Group A inspection shall be in accordance with MIL-PRF-38534 and as follows:  
a. Tests shall be as specified in table II herein.  
b. Subgroups 5 and 6 shall be omitted.  
c. Subgroups 7 and 8 shall include verification of the truth table on figure 3.  
4.3.2 Group B inspection (PI). Group B inspection shall be in accordance with MIL-PRF-38534.  
SIZE  
STANDARD  
5962-94611  
A
MICROCIRCUIT DRAWING  
REVISION LEVEL  
SHEET  
DEFENSE SUPPLY CENTER COLUMBUS  
COLUMBUS, OHIO 43216-5000  
30  
R
DSCC FORM 2234  
APR 97  
 复制成功!