TABLE I. Electrical performance characteristics.
Test
Symbol
Conditions 1/ 2/
-55°C ≤ TC ≤ +125°C
Group A
subgroups
Device
types
Limits
Unit
VSS = 0 V dc
Min
Max
+4.5 V dc ≤ VCC ≤ +5.5 V dc
unless otherwise specified
DC PARAMETERS
Supply current,
32-bit mode
ICC32
1,2,3
1,2,3
01-04
05-18
120
600
mA
CS = VIL, OE = VIH,
f = 5 MHz CMOS compatible
VCC = +5.5 V dc
Standby current
ISB
01,02
03,04
2.4
5.0
60
mA
CS = VCC, OE = VIH,
f = 5 MHz CMOS compatible
VCC = +5.5 V dc
05-08,
12-15
09-11,
16-18
80
10
Input leakage current
Output leakage current
ILI
VCC = +5.5 V dc,
1,2,3
1,2,3
All
µA
µA
VIN = GND or VCC
ILO
All
10
CS = VIH, OE = VIH,
VOUT = GND or VCC
Output low voltage
Output high voltage
DATA RETENTION
VOL
VCC = +4.5 V dc, IOL = +2.1
mA
1,2,3
01-07,
12-14
0.4
V
VCC = +4.5 V dc, IOL = +8.0
mA
08-11,
15-18
0.4
VOH
VCC = +4.5 V dc, IOH = -1.0
mA
1,2,3
01-07,
12-14
2.4
V
VCC = +4.5 V dc, IOH = -4.0
mA
08-11,
15-18
2.4
2.0
Data retention supply
voltage
VDR
1,2,3
1,2,3
All
5.5
V
CS ≥ VCC - 0.2 V dc
Data retention current
ICCDR1
VCC = +3.0 V dc
01-04
1.6
mA
05-11,
18
11.6
12-17
20.0
See footnotes at end of table.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-93187
A
REVISION LEVEL
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
L
6
DSCC FORM 2234
APR 97
WEDC [ WHITE ELECTRONIC DESIGNS CORPORATION ]
