SVRTR2800D Series
6.5 RADIATION HARDNESS ASSURANCE
VPT takes a conservative approach to radiation testing to ensure product performance in a space environment. VPT’s DLA-approved
Radiation Hardness Assurance (RHA) plan documents VPT’s processes and procedures for guaranteeing the performance of VPT
products under various environmental conditions in space including Total Ionizing Dose (TID) and Single-Event Effects (SEE).
Additionally, Enhanced Low Dose-Rate Sensitivity (ELDRS) effects are considered for all bipolar ICs used in the hybrid. Hardness is
guaranteed by a combination of both hybrid-level characterization and Radiation Lot Acceptance Testing (RLAT) of all sensitive
semiconductor piece-parts used within the hybrid.
6.5.1 Radiation Test and Performance Levels
Hybrid-Level
Characterization
Radiation Environment
Piece Part RLAT
High Dose Rate (HDR)
Low Dose Rate (LDR)
100 krad(Si)
1100 krad(Si)
Not applicable
Not applicable
100 krad(Si)
100 krad(Si)
≥ 85 MeV/mg/cm2
≥ 85 MeV/mg/cm2
Total Ionizing Dose
(TID)
Destructive (SEB, SEGR, SEL)
2Non-Destructive (SET, SEU, SEFI)
Single-Event Effects
(SEE)
1.
2.
Piece-part LDR screening performed only on potentially ELDRS parts (bipolar ICs).
The PWM IC used in this part is suceptible to a non-destructive SEFI/SEL event with threshold LET ≥ 42 MeV/mg/cm2. The SEFI manifests as a shutdown for up
to 1 second followed by a controlled soft-start of the converter. The non-destructive SEL manifests itself as a shutdown requiring user intervention to recover by
cycling either the input power or the inhibit function. At the worst-case 125 °C and 85 MeV/mg/cm2, the cross-section of these events is 3.18 x 10-6 cm2. Full details
available in the Radiation Test Report.
6.5.2 RHA Plan Summary
Test
RHA Plan for SVR Series Isolated DC-DC Converters
Sensitive semiconductor components undergo RLAT to 100 krad(Si) per
MIL-STD-883 Method 1019. Converters are characterized to 100 krad(Si).
Total Ionizing Dose (TID):
All bipolar linear ICs are characterized for ELDRS and tested in accordance
with MIL-STD-883 test method 1019 section 3.13
Enhanced Low Dose Rate Sensitivity (ELDRS):
Converters are characterized to LET ≥ 85 MeV/mg/cm2 for both catastrophic
events (SEL, SEB, SEGR) and functional interrupts (SEFI) under heavy ion
exposure. Converters are also characterized for cross-section and magnitude
of output transients (SET) for at least 3 different LET levels.
Single Event Effects (SEE):
All production lots of sensitive semiconductor components undergo RLAT for
TID at HDR and/or LDR as appropriate per part type.
Radiation Lot Acceptance Testing (RLAT):
6.5.3 RHA Designators available on SMD
The SVRTR2800D series converters are available on SMD with RHA level R. See section 8.0 for full SMD number information.
6.5.4 Supporting Documentation Available (Contact Sales)
DLA-approved RHA plan covering TID, SEE, and ELDRS
•
•
Radiation Hardness Assurance Plan:
Worst-Case Analysis Report:
Detailed worst-case analysis including electrical stress/derating limits and
guaranteed circuit performance post-radiation and end of life
Overview of piece-part RLAT and hybrid characterization for all guaranteed
environments. Also includes SEE cross-section data.
•
Radiation Test Summary Report:
MTBF report based on MIL-HDBK-217 reliability calculations.
Component temperature rise analysis and measurement results.
•
•
Reliability Report:
Thermal Analysis Report:
Sales Information
Phone:(425) 353-3010
Fax: (425) 353-4030
SVRTR2800D - 9.0
Page 10
E-mail: vptsales@vptpower.com
Web: www.vptpower.com
VPT [ VPT, Inc. ]
