VIS
Parameter
Operating current
Precharge standby
current in Power
down mode
Precharge standby
current in Nonpower
down mode
I
CC2P
I
CC2PS
I
CC2N
Symbol
I
CC1
Preliminary
VG36256401A
VG36256801A
VG36256161A
CMOS Synchronous Dynamic RAM
DC Characteristics (Recommended Operating Conditions unless otherwise noted)
-75
Test Conditions
Burst length = 1
One bank active
t
RC
≥
t
RC(MIN.)
, Io = 0mA
x4
x8
x16
Min
Max
145
155
165
2
2
20
-8H
Min
Max
115
125
135
2
2
20
Unit
mA
Notes
1
≤
V
IL(MAX.)
t
CK
= min.
CKE
≤
V
IL(MAX.)
t
CK
=
∞
CKE
CKE
≥
V
IH(MIN.)
t
CK
= min.
CS
≥
V
IH(MIN.)
Input signals are changed one
time during 2 CLK cycles.
mA
mA
I
CC2NS
CKE
≥
V
IH(MIN.)
t
CK
=
∞
CLK
≤
V
IL(MAX.)
Input signals are stable.
7
7
Active standby current I
CC3P
in Power
I
CC3PS
down mode
Active standby
I
CC3N
current in Nonpower
down mode
≤
V
IL(MAX.)
t
CK
= min.
CKE
≤
V
IL(MAX.)
t
CK
=
∞
CKE
CKE
≥
V
IH(MIN.)
t
CK
= min.
CS
≥
V
IH(MIN.)
Input signals are changed one
time during 2CLKs
CKE
≥
V
IH(MIN.)
t
CK
=
∞
CLK
≤
V
IL(MAX.)
Input signals are stable.
7
5
30
7
5
30
mA
mA
I
CC3NS
20
20
Operating current
(Burst mode)
Refresh current
Self refresh Current
Input Ieakage current
(Inputs)
Intput leakage current
(I/O pins)
Output Low Voltage
Output High Voltage
I
CC4
t
CK
≥
t
CK(MIN.
Io = 0mA
All banks Active
t
RC
= 4 x t
RC(MIN)
CKE
≤
0.2V
V
IN
≥
0, V
IN
≤
V
DD(MAX)
Pins not under test = 0V
V
OUT
≥
0, V
OUT
I
OL
= 2mA
I
OH
= -2mA
x4
x8
x16
I
CC5
I
CC6
l
LI
l
LO
V
OL
V
OH
150
160
170
190
1
-1
-1.5
1
1.5
0.4
2.4
2.4
-1
-1.5
120
130
140
190
1
1
1.5
0.4
mA
mA
mA
uA
uA
V
V
2
3
≤
V
DD(MAX)
DQ# in H - Z., Dout Disabled
4
4
Notes : 1. I
CC1
depends on output loading and cycle rates. Specified values are obtained with the output open.
In addition to this, I
CC1
is measured on condition that addresses are changed only one time during t
CK(MIN.)
.
2. I
CC4
depends on output loading and cycle rates. Specified values are obtained with the output open.
In addition to this, I
CC4
is measured on condition that addresses are changed only one time during t
CK(MIN.)
.
3. I
CC5
is measured on condition that addresses are changed only one time during t
CK(MIN.)
4. For LVTTL compatible.
Document : 1G5-0155
Rev.1
Page 5
VML [ VANGUARD INTERNATIONAL SEMICONDUCTOR ]
