DG406/407
Vishay Siliconix
SPECIFICATIONS
a
(FOR SINGLE SUPPLY)
Test Conditions
Unless Otherwise Specified
V+ = 12 V, V- = 0 V
Parameter
Analog Switch
Analog Signal Range
e
Drain-Source
On-Resistance
Source Off Leakage Current
Drain Off Leakage Current
Symbol
V
ANALOG
r
DS(on)
V
D
= 3 V, 10 V, I
S
= - 1 mA
Sequence Each Switch On
V
EN
= 0 V
V
D
= 10 V or 0.5 V
V
S
= 0.5 V or 10 V
V
S
= V
D
= ± 10
Sequence Each
Switch On
V
AL
= 0.8 V, V
AH
= 2.4 V
f
Temp
b
Full
Room
Room
Room
DG406
DG407
DG406
DG407
Room
Room
Room
Room
90
5
0.01
0.04
0.04
0.04
0.04
nA
Typ
c
A Suffix
- 55 to 125 °C
Min
d
0
Max
d
12
120
D Suffix
- 40 to 85 °C
Min
d
0
Max
d
12
120
Unit
V
Ω
%
r
DS(on)
Matching Between Channels
g
Δr
DS(on)
I
S(off)
I
D(off)
I
D(on)
Drain On Leakage Current
Dynamic Characteristics
Switching Time of Multiplexer
Enable Turn-On Time
Enable Turn-Off Time
Charge Injection
Power Supplies
Positive Supply Current
Negative Supply Current
t
OPEN
t
ON(EN)
t
OFF(EN)
Q
V
S1
= 8 V, V
S8
= 0 V, V
IN
= 2.4 V
V
INH
= 2.4 V, V
INL
= 0 V
V
S1
= 5 V
C
L
= 1 nF, V
S
= 6 V, R
S
= 0
Room
Room
Room
Room
Room
Full
Room
Full
300
250
150
20
13
- 0.01
- 20
- 20
450
600
300
450
600
300
pC
ns
I+
V
EN
= 0 V or 5 V, V
A
= 0 V or 5 V
I-
30
75
- 20
- 20
30
75
µA
Notes:
a. Refer to PROCESS OPTION FLOWCHART.
b. Room = 25 °C, Full = as determined by the operating temperature suffix.
c. Typical values are for DESIGN AID ONLY, not guaranteed nor subject to production testing.
d. The algebraic convention whereby the most negative value is a minimum and the most positive a maximum, is used in this data sheet.
e. Guaranteed by design, not subject to production test.
f. V
IN
= input voltage to perform proper function.
g.
Δr
DS(on)
= r
DS(on)
MAX - r
DS(on)
MIN.
h. Worst case isolation occurs on Channel 4 due to proximity to the drain pin.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
Document Number: 70061
S-71009–Rev. I, 14-May-07
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