Test Points Description
Test nodes are labeled and include a SMT test point for attaching miniature probes, clips or hooks.
Table 1
Primary referred
Name
Description
test point descriptions
+IN_FUSED,
+IN_FILT,
–IN
Provide measurement testpoints for the input voltage to the board in various locations, rela-
tive to the –IN board lug. +IN_FUSED is taken after input fusing, +IN_FILT is taken after the
input filtering network.
Provide Kelvin connection to input pins of the DCM. Use these test points for measuring the
input voltage at the module, excluding errors due to finite connection resistance leading up
to the module.
+IN_DCM,
–IN_DCM
Testpoint for Signal Ground on the primary/input side of the isolation boundary. This is the
reference for all primary side control circuitry and all control pins of the DCM.
PRI_SG
EXT_EN
PRI_EN
EXT_TR
PRI_TR
PRI_FT
Testpoint to drive the ENABLE signal (relative to PRI_SG) using an external source.
Testpoint to measure the ENABLE signal (relative to PRI_SG).
Testpoint to drive the TRIM signal (relative to PRI_SG) using an external source.
Testpoint to measure the TRIM signal (relative to PRI_SG).
Testpoint to measure the FAULT signal (relative to PRI_SG).
Table 2
Secondary referred
Name
Description
test point descriptions
Output voltage test points provide Kelvin connection to output pin group of the DCM. Use
these test points for measuring the output voltage at the module, excluding voltage errors
due to finite connection resistance and the module output current.
+OUT_DCM,
–OUT_DCM
+OUT_DCM_SHNT, Provides measurement testpoints for the output voltage in various locations, relative to the
+OUT,
–OUT
–OUT board lug. +OUT_DCM_SHNT is taken before the output filtering, and +OUT is taken
at the +OUT board lug.
Testpoints for the +5V bias supply return, and for measuring the FT_SEC fault monitor out-
put.
SEC_SG
FT_SEC
+5 V
Testpoint to measure the FAULT signal relative to SEC_SG once it has passed through the
opto-coupler, if used. Bias power must be supplied to +5V for voltage output to appear here.
Testpoint to provide a bias voltage (relative to secondary ground) for the fault opto-coupler,
if used.
UG:017
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