3.4
Inspection. The inspection requirements of MIL-PRF-55310 apply to all devices delivered
to this document. Inspection conditions and standards are documented in accordance with
the Quality Assurance System as defined in QSP-90100 (ISO-9001 derived).
Traceability. Active device lots are homogenous and traceable to the manufacturer s
individual wafer. Crystals are traceable to the quartz bar and the processing details of the
autoclave lot, as applicable. All other elements and materials are traceable to their incoming
inspection lots.
Marking. Device marking shall be in accordance with the requirements of MIL-PRF-55310.
Packaging. All devices delivered are packaged in such a manner that they will be protected
from damage during shipping, handling, and storage. Devices are packaged in anti-static
packaging and identified as being static sensitive in accordance with QSP-91502.
DETAIL REQUIREMENTS
Components.
Crystals. Design and construction of crystal units are in accordance with MIL-C-3098 and
the applicable detailed crystal specification drawing for the device being delivered. Crystal
units utilize a 4 point mount structure. When radiation environment R is specified (see
paragraph 1.2.3) premium Q swept cultured quartz will be used.
Discrete Passive Components. Discrete passive components are either high reliability
military parts or established reliability (ER) military parts with a failure rate level R or better.
Ceramic capacitors are procured per MIL-C-123 or are subjected to destructive physical
analysis (DPA) and humidity, steady state and low voltage testing IAW MIL-C-123.
Packaged Semiconductors. Packaged semiconductors are of the type JAN, JANTX, or
JANTXV IAW MIL-PRF-19500. Class 1 oscillators, screening option R, may use plastic
encapsulated surface mount devices screened IAW with MIL-PRF-19500 for JAN or
JANTX.
Microcircuits. Microcircuits are procured from wafer lots that have passed
MIL-PRF-55310 Lot Acceptance Tests for Class S devices.
Hybrid Elements. The dies used in hybrid circuitry are procured from wafer lots that
have passed MIL-PRF-55310 Lot Acceptance Tests for Class S devices. Multilayer,
ceramic chip capacitors are subjected to DPA, and humidity, steady state and low voltage
testing in accordance with MIL-C-123.
Materials. The materials, packages, terminals, and finishes used in the construction of
devices, procured per this specification, shall meet the requirements of MIL-PRF-55310.
UNSPECIFIED TOLERANCES
3.5
3.6
3.7
4.
4.1
4.1.1
4.1.2
4.1.3
4.1.4
4.1.5
4.2
SIZE
CODE IDENT NO.
DWG NO.
REV.
SHEET
A
00136
N/A
OS-80001
B
5
VECTRON [ Vectron International, Inc ]
