ULN2003
LINEAR INTEGRATED CIRCUIT
TEST CIRCUIT
Components in the test circuits are used only to obtain and confirm the device characteristics. These components
and circuits are not guaranteed to prevent malfunction or failure from occurring in the application equipment.
1. ILEAK
2. VCEO(SAT),hFE
OPEN
OPEN
ILEAK
VCE
IOUT
IIN
OPEN
VIN
VIN
VCE,VCEO(SAT)
hFE=
IOUT
IIN
3. IIN(ON)
4. IIN(OFF)
OPEN
OPEN
IOUT
IIN(OFF)
IIN(ON)
OPEN
VIN
6.
IR
5. VIN(ON)
OPEN
IR
IOUT
OPEN
VR
VIN(ON)
VCE
OPEN
UNISONIC TECHNOLOGIES CO., LTD
4 of 10
QW-R113-001.J
www.unisonic.com.tw
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