AGR26045EF
45 W, 2.535 GHz—2.655 GHz, N-Channel E-Mode, Lateral MOSFET
Introduction
The AGR26045EF is a high-voltage, gold-metalized,
enhancement mode, laterally diffused metal oxide
semiconductor (LDMOS) RF power transistor suit-
able for ultrahigh-frequency (UHF) applications,
including multichannel multipoint distribution service
(MMDS) for broadcasting and communications.
Table 1. Thermal Characteristics
Parameter
Thermal Resistance,
Junction to Case
Sym
R
ı
JC
Value
1.5
Unit
°C/W
Table 2. Absolute Maximum Ratings*
Parameter
Sym Value
Drain-source Voltage
V
DSS
65
Gate-source Voltage
V
GS
–0.5, +15
Total Dissipation at T
C
= 25 °C P
D
117
Derate Above 25
°C
—
0.67
Operating Junction Tempera-
T
J
200
ture
Storage Temperature Range T
STG
–65, +150
Unit
Vdc
Vdc
W
W/°C
°C
°C
Figure 1. AGR26045EF (flanged) Package
Features
Typical performance for MMDS systems.
f = 2600 MHz, I
DQ
= 430 mA, Vds = 28 V, adjacent
channel BW = 3.84 MHz, 5 MHz offset; alternate
channel BW = 3.84 MHz, 10 MHz offset. Typical
P/A ratio of 9.8 dB at 0.01% (probability) CCDF*:
— Output power: 6.5 W.
— Power gain: 13 dB.
— Efficiency: 20% .
— ACPR: –34 dBc.
— ACLR1: –36 dBc.
— Return loss: –15 dB.
Typical pulsed P1dB, 6 µs pulse at 10% duty: 47 W.
High-reliability, gold-metalization process.
Low hot carrier injection (HCI) induced bias drift
over 20 years.
Internally matched.
High gain, efficiency, and linearity.
Integrated ESD protection.
Device can withstand a 10:1 voltage standing wave
ratio (VSWR) at 28 Vdc, 2600 MHz, 45 W continu-
ous wave (CW) output power.
Large signal impedance parameters available.
*The test signal utilized is 4-channel W-CDMA Test Model 1. This
test signal provides an equivalent reference (occupied bandwidth
and waveform EPF) for the actual performance with an MMDS
waveform.
* Stresses in excess of the absolute maximum ratings can cause
permanent damage to the device. These are absolute stress rat-
ings only. Functional operation of the device is not implied at
these or any other conditions in excess of those given in the
operational sections of the data sheet. Exposure to absolute
maximum ratings for extended periods can adversely affect
device reliability.
Table 3. ESD Rating*
AGR26045EF
HBM
MM
CDM
Minimum (V)
500
50
1500
Class
1B
A
4
* Although electrostatic discharge (ESD) protection circuitry has
been designed into this device, proper precautions must be
taken to avoid exposure to ESD and electrical overstress (EOS)
during all handling, assembly, and test operations.
PEAK Devices
Agere
employs a human-body model (HBM), a machine model (MM),
and a charged-device model (CDM) qualification requirement in
order to determine ESD-susceptibility limits and protection
design evaluation. ESD voltage thresholds are dependent on the
circuit parameters used in each of the models, as defined by
JEDEC's JESD22-A114B (HBM), JESD22-A115A (MM), and
JESD22-C101A (CDM) standards.
Caution: MOS devices are susceptible to damage from elec-
trostatic charge. Reasonable precautions in han-
dling and packaging MOS devices should be
observed.
TRIQUINT [ TRIQUINT SEMICONDUCTOR ]
