TS2G~8GCF266
266X CompactFlash Card
ꢃ
SMART Data Structure
BYTE
0-1
F / V
X
Decription
Revision code
2-361
362
X
Vendor specific
V
Off line data collection status
363
X
Self-test execution status byte
364-365
366
V
Total time in seconds to complete off-line data collection activity
Vendor specific
X
367
F
Off-line data collection capability
368-369
F
SMART capability
Error logging capability
7-1 Reserved
0 1=Device error logging supported
370
F
371
X
F
F
F
R
F
V
V
V
V
V
V
V
Vendor specific
372
Short self-test routine recommended polling time (in minutes)
373
Extended self-test routine recommended polling time (in minutes)
374
Conveyance self-test routine recommended polling time (in minutes)
375-385
386-395
396
Reserved
Date Code
Number of MU in device (0~n)
MU number
397+(n*6)
398+(n*6)
400+(n*6)
401+(n*6)
402+(n*6)
511
MU data block
MU spare block
Init. Bad block
Last Defect Bad block ( Newest state)
Data structure checksum
F=the content of the byte is fixed and does not change.
V=the content of the byte is variable and may change depending on the state of the device or
the commands executed by the device.
X=the content of the byte is vendor specific and may be fixed or variable.
R=the content of the byte is reserved and shall be zero.
* 4 Byte value : [MSB] [2] [1] [LSB]
Above technical information is based on CFA standard data and tested to be reliable. However, Transcend makes no
warranty, either expressed or implied, as to its accuracy and assumes no liability in connection with the use of this
product. Transcend reserves the right to make changes in specifications at any time without prior notice.
Transcend Information Inc.
80
TRANSCEND [ TRANSCEND INFORMATION. INC. ]
