6N137
Test Circuit 1.
5V
t
pHL
and t
pLH
Input
t
pHL
t
pLH
Output V
O
1.5V
V
OH
V
OL
350mV(I
F
= 7.5mA)
175mV(I
F
= 3.75mA)
Pulse
generator
Z
O
= 50Ω
t
r
= 5ns
I
F
47Ω
1
2
3
4
GND
V
CC
8
7
6
5
0.1μF
By-
pass
C
L
R
L
Output
V
O
monitor-
ing
node
Monitoring
Node
�½�
C
L
is approximately 15pF which includes probe and stray wiring capacitance.
Test Circuit 2.
t
EHL
and t
ELH
Pulse
generator
Z
O
= 50Ω
t
r
= 5ns
3.0V
Input V
E
t
EHL
t
ELH
Output V
O
1.5V
V
OH
V
OL
1.5V
7.5mA
dc
I
F
Input V
E
Monitoring node
5V
1
2
3
4
GND
V
CC
8
0.1μF
7
6
5
By-
pass
C
L
R
L
V
O
Output
monitor-
ing
node
�½�
C
L
is approximately 15pF which includes prove and stray wiring capacitance.
Test Circuit 3.
Transient immunity and typical waveforms
1
90%
10%
t
r
V
O
Switch at A : I
F
= 0mA
V
O
Switching at B : I
F
= 5mA
V
OL
10%
90%
t
f
5V
V
FF
10V
0V
B
4
Pulse gen.
Z
O
= 50Ω.
V
CM
GND
I
F
A
2
3
V
CC
8
7
6
5
0.1μF
By-
pass
5V
R
L
V
O
5
2007-10-01
TOSHIBA [ TOSHIBA SEMICONDUCTOR ]
