XC9260/XC9261
Series
■TEST
CIRCUITS
(*1)
< Circuit No.① >
Wave Form Measure Point
L
A
V
IN
CE
AGND
L
X
V
OUT
PGND
C
L
V
A
V
IN
CE
AGND
L
X
V
OUT
PGND
< Circuit No.② >
C
IN
R
L
1μF
※
External Components
f
OSC
= 1.2MHz
L : 4.7μH(LTF5022T-4R7N2R0-LC)
C
IN
: 10μF(ceramic)
C
L
: 10μF(ceramic)
※
External Components
f
OSC
= 3.0MHz
L : 1.0μH(LQM2MPN1R0MGH)
C
IN
: 10μF(ceramic)
C
L
: 10μF(ceramic)
< Circuit No.③ >
Wave Form Measure Point
V
IN
CE
AGND
L
X
V
OUT
PGND
Rpulldown
200Ω
< Circuit No.④ >
V
IN
CE
AGND
L
X
V
OUT
PGND
V
I
LX
1uF
1μF
R
LXH
= (V
IN
-V
Lx
)/I
LX
R
LXL
= V
Lx
/I
LX
< Circuit No.⑤ >
I
LeakH
V
IN
L
X
V
OUT
PGND
A
I
LeakL
< Circuit No.⑥ >
V
IN
CE
AGND
Wave Form Measure Point
L
X
I
LIMH
V
OUT
PGND
V
1μF
I
CEH
A
I
CEL
CE
AGND
1μF
< Circuit No.⑦ >
B TYPE
V
IN
1μF
CE
AGND
V
OUT
PGND
A
L
X
(*1)
In the case of SOT-89-5, AGND and PGND are treated as V
SS
.
9/28
TOREX [ TOREX SEMICONDUCTOR ]
