XC9116
Series
■
TEST CIRCUITS
●Circuit ①
XC9116B02A series
●Circuit ①
XC9116D02A series
●Circuit ②
OSC
A
V
IN
V
IN
CE
1uF
V
SS
V
CE
V
FB
Lx
FB
Rpull
●Circuit ③
A
V
IN
A
CE
V
SS
V
CE
Lx
FB
A
V
FB
V
Lx
A
220uF
Vpull
V
IN
1uF
●Circuit ④
OSC
V
IN
CE
V
IN
1uF
VCE
10ohm
300ohm
1uF
4.4V
Lx
FB
V
SS
2SK583
11kohm
Vpull
1.1kohm
0.01uF
220uF
V
1. The measurement method of LX ON Resistance R
SWON
Using the circuit
②,
Lx ON resistance can be measured by adjusting Vpull voltage to set Lx voltage V
Lx
0.4V when the
driver transistor is ON.
The oscilloscope is used for measuring the Lx voltage when the driver transistor is ON.
R
SWON
= 0.4 / ((Vpull - 0.4) /10)
2. The measurement method of current limit ILIM
Using the circuit
④,
current limit I
LIM
can be calculated by the equation including Vpull voltage when FB voltage is
decreased while Vpull voltage is adjusted and Lx voltage V
Lx
when the driver transistor is ON.
The oscilloscope is used for measuring the Lx voltage when the driver transistor is ON.
I
LIM
= (Vpull - V
Lx
) / Rpull
12/22
TOREX [ TOREX SEMICONDUCTOR ]
