SLRS027J – DECEMBER 1976 – REVISED JUNE 2010
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PARAMETER MEASUREMENT INFORMATION
Open
VCE
ICEX
Open
VI
Open
VCE
ICEX
Figure 1. I
CEX
Test Circuit
Open
II(off)
VCE
IC
Figure 2. I
CEX
Test Circuit
Open
II(on)
VI
Open
Figure 3. I
I(off)
Test Circuit
A.
I
I
is fixed for measuring V
CE(sat)
, variable for measuring h
FE
.
Open
hFE =
IC
II
Figure 4. I
I
Test Circuit
Open
II
VCE
IC
VI(on)
VCE
IC
Figure 5. h
FE
, V
CE(sat)
Test Circuit
VR
IR
Figure 6. V
I(on)
Test Circuit
VF
Open
IF
Open
Figure 7. I
R
Test Circuit
Figure 8. V
F
Test Circuit
Figure 9. Propagation Delay-Time Waveforms
8
Copyright © 1976–2010, Texas Instruments Incorporated
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