ULN2001A, ULN2002A, ULN2003A, ULN2004A
DARLINGTON TRANSISTOR ARRAYS
SLRS027 – DECEMBER 1976 – REVISED APRIL 1993
switching characteristics, T
A
= 25°C
PARAMETER
tPLH
tPHL
VOH
Propagation delay time, low-to-high-level output
Propagation delay time, high-to-low-level output
High-level output voltage after switching
TEST CONDITIONS
See Figure 9
VS = 50 V,
See Figure 10
IO
≈
300 mA,
VS – 20
MIN
TYP
0.25
0.25
MAX
1
1
UNIT
µs
µs
mV
PARAMETER MEASUREMENT INFORMATION
Open
VCE
ICEX
Open
VI
Open
VCE
ICEX
Figure 1. I
CEX
Test Circuit
Open
II(off)
VCE
Figure 2. I
CEX
Test Circuit
Open
IC
II(on)
VI
Open
Figure 3. I
I(off)
Test Circuit
Open
IC
hFE =
II
Figure 4. I
I
Test Circuit
Open
II
VCE
IC
VI(on)
VCE
IC
NOTE: II is fixed for measuring VCE(sat), variable for
measuring hFE.
Figure 5. h
FE
, V
CE(sat)
Test Circuit
Figure 6. V
I(on)
Test Circuit
4
POST OFFICE BOX 655303
•
DALLAS, TEXAS 75265
TI [ TEXAS INSTRUMENTS ]
