www.ti.com
SBAS405 – MARCH 2007
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be
more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
ORDERING INFORMATION
(1)
TYPICAL
INTEGRAL
LINEARITY
(LSB)
TYPICAL
GAIN
ERROR
(LSB)
NO MISSING
CODES
RESOLUTION
(BITS)
PACKAGE
TYPE
16-Pin,
5 x 6.4
TSSOP
TSC2007I
±1.5
0.1
11
12-Pin,
3 x 4 Matrix,
1.5 x 2
WCSP
PACKAGE
DESIGNATOR
PW
SPECIFIED
TEMPERATURE
RANGE
–40°C to +85°C
PACKAGE
MARKING
TSC2007I
ORDERING
NUMBER
TSC2007IPW
TSC2007IPWR
TSC2007IYZGT
YZG
–40°C to +85°C
TSC2007I
TSC2007IYZGR
TRANSPORT
MEDIA,
QUANTITY
Tube, 90
Tape and
Reel, 2000
Small Tape
and Reel, 250
Tape and
Reel, 3000
PRODUCT
(1)
For the most current package and ordering information, see the Package Option Addendum located at the end of this data sheet, or see
the TI website at
www.ti.com.
ABSOLUTE MAXIMUM RATINGS
(1)
Over operating free-air temperature range (unless otherwise noted)
TSC2007
Voltage
Voltage range
Digital input voltage to GND
Digital output voltage to GND
Power dissipation
TSSOP Package
Thermal impedance,
θ
JA
Operating free-air temperature range, T
A
Storage temperature range, T
STG
Junction temperature, T
J
Max
Lead temperature
(1)
Vapor phase (60 sec)
Infrared (15 sec)
WCSP package
Low-K
High-K
Analog input X+, Y+, AUX to GND
Analog input X–, Y– to GND
VDD to GND
–0.4 to VDD + 0.1
–0.4 to VDD + 0.1
–0.3 to +5
–0.3 to VDD + 0.3
–0.3 to VDD + 0.3
(T
J
Max - T
A
)/θ
JA
86
113
62
–40 to +85
–65 to +150
+150
+215
+220
°C
°C
°C
°C
°C
°C/W
UNIT
V
V
V
V
V
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated is not implied. Exposure to
absolute-maximum rated conditions for extended periods may affect device reliability.
2
TI [ TEXAS INSTRUMENTS ]
