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TSC2003IPWR 参数 Datasheet PDF下载

TSC2003IPWR图片预览
型号: TSC2003IPWR
PDF下载: 下载PDF文件 查看货源
内容描述: I2C触摸屏控制器 [I2C TOUCH SCREEN CONTROLLER]
分类和应用: 控制器
文件页数/大小: 22 页 / 416 K
品牌: TI [ TEXAS INSTRUMENTS ]
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TSC2003
TSC
200
3
TSC
200
3
SBAS162D – NOVEMBER 2000 – REVISED SEPTEMBER 2004
I
2
C TOUCH SCREEN CONTROLLER
FEATURES
q
2.5V TO 5.25V OPERATION
q
INTERNAL 2.5V REFERENCE
q
DIRECT BATTERY MEASUREMENT
(0.5V TO 6V)
q
ON-CHIP TEMPERATURE MEASUREMENT
q
TOUCH-PRESSURE MEASUREMENT
q
I
2
C INTERFACE SUPPORTS:
Standard, Fast, and High-Speed Modes
q
AUTO POWER DOWN
q
TSSOP-16 AND VFBGA-48 PACKAGES
DESCRIPTION
The TSC2003 is a 4-wire resistive touch screen controller. It
also features direct measurement of two batteries, two aux-
iliary analog inputs, temperature measurement, and touch-
pressure measurement.
The TSC2003 has an on-chip 2.5V reference that can be
utilized for the auxiliary inputs, battery monitors, and tem-
perature-measurement modes. The reference can also be
powered down when not used to conserve power. The
internal reference will operate down to 2.7V supply voltage
while monitoring the battery voltage from 0.5V to 6V.
The TSC2003 is available in the small TSSOP-16 and
VFBGA-48 packages and is specified over the –40°C to
+85°C temperature range.
APPLICATIONS
q
q
q
q
q
q
PERSONAL DIGITAL ASSISTANTS
PORTABLE INSTRUMENTS
POINT-OF-SALES TERMINALS
PAGERS
TOUCH SCREEN MONITORS
CELLULAR PHONES
V
DD
PENIRQ
X+
X–
TEMP0
TEMP1
SCL
V
DD
SAR
SDA
Y+
Y–
CDAC
I
2
C
Interface
and
Control
Logic
A0
IN1
IN2
V
BAT1
Channel Select
Internal
Clock
Comparator
MUX
A1
V
BAT2
V
REF
Internal
+2.5V
REF
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright © 2000-2004, Texas Instruments Incorporated
www.ti.com