TPS730xx
www.ti.com
SBVS054E – NOVEMBER 2004 – REVISED AUGUST 2005
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated
circuits be handled with appropriate precautions. Failure to observe proper handling and installation
procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision
integrated circuits may be more susceptible to damage because very small parametric changes could
cause the device not to meet its published specifications.
ORDERING INFORMATION
(1)
PRODUCT
TPS730xxyyyz
V
OUT (2)
XX
is nominal output voltage (for example, 28 = 2.8V, 01 = Adjustable).
YYY
is package designator.
Z
is package quantity.
(1)
(2)
For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
website at
Output voltages from 1.2V to 4.5V in 50mV increments are available through the use of innovative factory EEPROM programming;
minimum order quantities may apply. Contact factory for details and availability.
ABSOLUTE MAXIMUM RATINGS
over operating temperature range (unless otherwise noted)
(1)
UNIT
V
IN
range
V
EN
range
V
OUT
range
Peak output current
ESD rating, HBM
ESD rating, CDM
Continuous total power dissipation
Junction temperature range
Storage temperature range, T
stg
(1)
-0.3 V to 6 V
-0.3 V to V
IN
+ 0.3 V
-0.3 V to 6 V
Internally limited
2 kV
500 V
See Dissipation Ratings Table
-40°C to 150°C
-65°C to 150°C
Stresses beyond those listed under
absolute maximum ratings
may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under
recommended operating
conditions
is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
2
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