SLVSAA4B – JUNE 2010 – REVISED JANUARY 2011
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FB2
V7V
PGOOD
AGND
V3V
GND
LOW_P
FB2
CMP2
SS2
RLIM2
GND
VIN
FB2
EN2
BST2
VIN2
LX2
LX2
LX1
LX1
VIN1
BST1
VIN2
V2
V1
VIN
VIN
VIN
V3
VIN3
GND
LX3
LX3
VIN3
BST3
EN3
TPS65251
VIN1
SYNC
ROSC
FB1
CMP1
RLIM3
SS3
CMP3
FB3
SS1
RLIM1
EN1
FB3
FB1
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
FUNCTIONAL BLOCK DIAGRAM
AGND
V3V
V7V
12V DC Supply
VIN1
SS1
from enable logic
EN1
Rlim1
BUCK1
FB1
COMP1
INTERNAL
VOLTAGE RAILS
OSC
SYNC
ROSC
FB3
FB1
BST1
LX1
LX1
Vout BUCK1
BST2
VIN2
SS2
from enable logic
EN2
Rlim2
BUCK2
FB2
COMP2
LX2
LX2
Vout BUCK2
BST3
VIN3
SS3
from enable logic
EN3
Rlim3
BUCK3
FB3
COMP3
LX3
LX3
Vout BUCK3
VIN
PFM mode
PGOOD
PG
Generator
LOW_P
GND
2
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