TLV3502-Q1
SBOS507 –FEBRUARY 2010
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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ABSOLUTE MAXIMUM RATINGS(1)
over operating free-air temperature range (unless otherwise noted)
Supply voltage
5.5 V
(V−) − 0.3 V to (V+) + 0.3 V
10 mA
Signal input terminal voltage(2)
Signal input terminal current(2)
Output short-circuit current(3)
Thermal impedance, junction to free air
Operating temperature
74 mA
200°C/W
−40°C to +125°C
−65°C to +150°C
150°C
Storage temperature
Junction temperature
Human Body Model (HBM)
3000 V
ESD rating
Charged-Device Model (CDM)
500 V
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not supported.
(2) Input terminals are diode-clamped to the power-supply rails. Input signals that can swing more than 0.3V beyond the supply rails should
be current limited to 10mA or less.
(3) Short circuit to ground, one comparator per package
RECOMMENDED OPERATING CONDITIONS
MIN
TYP
MAX UNIT
VS
VIL
VIH
TA
Supply voltage
2.2
2.7
5.5
V
V
Low-level input voltage, shutdown (comparator is enabled)(1)
High-level input voltage, shutdown (comparator is disabled)(1)
Operating temperature
(V+) - 1.7
(V+) - 0.9
-40
V
125
°C
(1) When the shutdown pin is within 0.9 V of the most positive supply, the part is disabled. When it is more than 1.7 V below the most
positive supply, the part is enabled.
2
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