TLC5510, TLC5510A
8-BIT HIGH-SPEED ANALOG-TO-DIGITAL CONVERTERS
SLAS095K – SEPTEMBER 1994 – REVISED MAY 1999
operatingcharacteristicsatV =5V,V
DD
=2.5V,V
=0.5V,f
=20MHz,T =25°C(unless
REFT
REFB
(CLK) A
otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
TLC5510
V
V
= 0.5 V – 2.5 V
= 0 V – 4 V
20 MSPS
20 MSPS
MHz
I(ANLG)
f
Maximum conversion rate
f = 1-kHz ramp
I
conv
TLC5510A
I(ANLG)
BW
Analog input bandwidth
Digital output delay time
Differential gain
At – 1 dB
14
18
1%
0.7
30
4
t
C
≤ 10 pF (see Note 1 and Figure 1)
L
30
ns
d(D)
NTSC 40 Institute of Radio Engineers (IRE)
modulation wave, = 14.3 MSPS
f
Differential phase
degrees
ps
conv
t
t
Aperture jitter time
Sampling delay time
AJ
ns
d(s)
t
Enable time, OE↓ to valid data
C
C
= 10 pF
= 10 pF
5
7
ns
ns
en
L
L
t
Disable time, OE↑ to high impedance
dis
T
= 25°C
45
43
45
46
43
42
39
39
46
44
A
Input tone = 1 MHz
Input tone = 3 MHz
Input tone = 6 MHz
Input tone = 10 MHz
Full range
= 25°C
T
A
Full range
= 25°C
Spurious free dynamic range (SFDR)
dB
dB
T
A
Full range
= 25°C
T
A
Full range
T
A
= 25°C
SNR
Signal-to-noise ratio
includes probe and jig capacitance.
Full range
NOTE 1:
C
L
t
t
w(L)
w(H)
CLK (clock)
t
d(s)
ANALOG IN
(input signal)
N+2
N+1
N+4
N
N+3
D1–D8
(output data)
N–3
N–2
N–1
N
N+1
t
d(D)
Figure 1. I/O Timing Diagram
5
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