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TL431ACDRG4 参数 Datasheet PDF下载

TL431ACDRG4图片预览
型号: TL431ACDRG4
PDF下载: 下载PDF文件 查看货源
内容描述: 精密可编程参考 [PRECISION PROGRAMMABLE REFERENCE]
分类和应用: 电源电路参考电压源光电二极管输出元件
文件页数/大小: 75 页 / 1547 K
品牌: TI [ TEXAS INSTRUMENTS ]
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SLVS543K – AUGUST 2004 – REVISED JUNE 2010
PRECISION PROGRAMMABLE REFERENCE
Check for Samples:
1
FEATURES
Operation From
−40°C
to 125°C
Reference Voltage Tolerance at 25°C
– 0.5% . . . B Grade
– 1%. . . A Grade
– 2% . . . Standard Grade
Typical Temperature Drift (TL431B)
– 6 mV (C Temp)
– 14 mV (I Temp, Q Temp)
Low Output Noise
0.2-Ω Typical Output Impedance
Sink-Current Capability . . . 1 mA to 100 mA
Adjustable Output Voltage . . . Vref to 36 V
TL431, TL431A, TL431B . . . P (PDIP), PS (SOP),
OR PW (TSSOP) PACKAGE
(TOP VIEW)
TL431, TL431A, TL431B . . . D (SOIC) PACKAGE
(TOP VIEW)
CATHODE
ANODE
ANODE
NC
1
2
3
4
8
7
6
5
REF
ANODE
ANODE
NC
CATHODE
NC
NC
NC
1
2
3
4
8
7
6
5
REF
NC
ANODE
NC
NC − No internal connection
NC − No internal connection
TL431, TL431A, TL431B . . . PK (SOT-89) PACKAGE
(TOP VIEW)
TL432, TL432A, TL432B . . . PK (SOT-89) PACKAGE
(TOP VIEW)
CATHODE
ANODE
ANODE
REF
ANODE
REF
ANODE
CATHODE
TL431, TL431A, TL431B . . . DBV (SOT-23-5) PACKAGE
(TOP VIEW)
TL432, TL432A, TL432B . . . DBV (SOT-23-5) PACKAGE
(TOP VIEW)
NC
1
2
3
5
4
ANODE
REF
NC
ANODE
NC
1
2
3
5
4
REF
CATHODE
CATHODE
NC − No internal connection
Pin 2 is attached to Substrate and must be
connected to ANODE or left open.
NC − No internal connection
TL431, TL431A, TL431B . . . DBZ (SOT-23-3) PACKAGE
(TOP VIEW)
TL432, TL432A, TL432B . . . DBZ (SOT-23-3) PACKAGE
(TOP VIEW)
CATHODE
REF
1
3
2
REF
ANODE
CATHODE
1
3
2
ANODE
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2004–2010, Texas Instruments Incorporated