TAS5711
SLOS600 –DECEMBER 2009
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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
SIMPLIFIED APPLICATION DIAGRAM
3.3 V
8 V–26 V
PVDD
AVDD/DVDD
LRCLK
SCLK
MCLK
SDIN
LCSE
OUT_A
Digital
Audio
Source
PVDD
BST_A
BST_B
LCSE
OUT_B
I2C
Control
SDA
SCL
PVDD
OUT_C
A_SEL(FAULT)
RESET
PDN
Control
Inputs
BST_C
BST_D
LCBTL
PLL_FLTP
PLL_FLTM
Loop
Filter(1)
OUT_D
B0264-09
(1) See TAS5711 EVM User's Guide (SLOU280) for loop filter values.
2
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