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SN74HC04DRE4 参数 Datasheet PDF下载

SN74HC04DRE4图片预览
型号: SN74HC04DRE4
PDF下载: 下载PDF文件 查看货源
内容描述: 六路反向器 [HEX INVERTERS]
分类和应用: 栅极触发器逻辑集成电路光电二极管
文件页数/大小: 21 页 / 1163 K
品牌: TI [ TEXAS INSTRUMENTS ]
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www.ti.com
SCLS078E – DECEMBER 1982 – REVISED OCTOBER 2010
HEX INVERTERS
Check for Samples:
1
FEATURES
Wide Operating Voltage Range of 2 V to 6 V
Outputs Can Drive Up To 10 LSTTL Loads
Low Power Consumption, 20-mA Max I
CC
Typical t
pd
= 8 ns
±4-mA Output Drive at 5 V
Low Input Current of 1
mA
Max
SN54HC04...J OR W PACKAGE
SN74HC04...D, DB, N, NS, OR PW PACKAGE
(TOP VIEW)
SN54HC04...FK PACKAGE
(TOP VIEW)
1A
NC
V
CC
1Y
1A
1Y
2A
2Y
3A
3Y
GND
1
2
3
4
5
6
7
14
13
12
11
10
9
8
V
CC
6A
6Y
5A
5Y
4A
4Y
3
2
1
2A
NC
2Y
NC
3A
4
5
6
7
8
20 19
18
17
16
15
14
6A
6Y
NC
5A
NC
5Y
9 10 11 12 13
GND
NC
3Y
4Y
NC
No internal connection
DESCRIPTION/ORDERING INFORMATION
The ’HC04 devices contain six independent inverters. They perform the Boolean function Y = A in positive logic.
ORDERING INFORMATION
T
A
PDIP – N
SOIC – D
PACKAGE
(1)
Reel of 1000
Reel of 1000
Reel of 2500
Tube of 250
–40°C to 85°C
SOP – NS
SSOP – DB
Reel of 2000
Reel of 2000
Tube of 90
TSSOP – PW
CDIP – J
–55°C to 125°C
CFP – W
LCCC –FK
(1)
Reel of 2000
Tube of 250
Reel of 1000
Reel of 900
Reel of 2200
ODERABLE PART NUMBER
SN74HC04N
SN74HC04DE4
SN74HC04DRG3
SN74HC04DT
SN74HC04NSR
SN74HC04NSRG4
SN74HC04DBR
SN74HC04DBRE4
SN74HC04PW
SN74HC04PWR
SN74HC04PWT
SNJ54HC04J
SNJ54HC04W
SNJ54HC04FK
HC04
HC04
HC04
HC04
TOP-SIDE MARKING
SN74HC04N
Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at
www.ti.com/sc/package.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 1982–2010, Texas Instruments Incorporated
4A