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SN74AHC1G14DCKR 参数 Datasheet PDF下载

SN74AHC1G14DCKR图片预览
型号: SN74AHC1G14DCKR
PDF下载: 下载PDF文件 查看货源
内容描述: 单施密特触发反相器 [SINGLE SCHMITT-TRIGGER INVERTER GATE]
分类和应用:
文件页数/大小: 9 页 / 239 K
品牌: TI [ TEXAS INSTRUMENTS ]
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SN74AHC1G14
SINGLE SCHMITT TRIGGER INVERTER GATE
SCLS321N − MARCH 1996 − REVISED JUNE 2005
D
Operating Range of 2 V to 5.5 V
D
Max t
pd
of 10 ns at 5 V
D
Low Power Consumption, 10-µA Max I
CC
DBV PACKAGE
(TOP VIEW)
D
±8-mA
Output Drive at 5 V
D
Latch-Up Performance Exceeds 250 mA Per
JESD 17
DCK PACKAGE
(TOP VIEW)
DRL PACKAGE
(TOP VIEW)
NC
NC
A
GND
NC – No internal connection
See mechanical drawings for dimensions.
1
5
1
2
3
5
V
CC
A
GND
4
V
CC
NC
A
1
2
3
5
V
CC
Y
2
Y
GND
4
3
4
Y
description/ordering information
The SN74AHC1G14 contains one inverter gate. The device performs the Boolean function Y = A.
The device functions as an independent inverter gate, but because of the Schmitt action, gates may have
different input threshold levels for positive- (V
T+
) and negative-going (V
T−
) signals.
ORDERING INFORMATION
TA
PACKAGE†
Reel of 3000
SOT (SOT-23) − DBV
−40 C 85°C
−40°C to 85 C
SOT (SC-70) − DCK
SOT (SOT-553) – DRL
Reel of 250
Reel of 3000
Reel of 250
Reel or 4000
ORDERABLE
PART NUMBER
SN74AHC1G14DBVR
SN74AHC1G14DBVT
SN74AHC1G14DCKR
SN74AHC1G14DCKT
SN74AHC1G14DRLR
AF_
AF_
A14_
TOP-SIDE
MARKING‡
† Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are
available at www.ti.com/sc/package.
‡ The actual top-side marking has one additional character that designates the assembly/test site.
FUNCTION TABLE
INPUT
A
H
L
OUTPUT
Y
L
H
logic diagram (positive logic)
2
A
4
Y
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright
2005, Texas Instruments Incorporated
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
1