5-V DUAL RS-232 LINE DRIVER/RECEIVER
WITH
±15-kV
ESD PROTECTION
SLLS576E – JULY 2003 – REVISED APRIL 2007
www.ti.com
DRIVER SECTION
Electrical Characteristics
(1)
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see
PARAMETER
V
OH
V
OL
I
IH
I
IL
I
OS (3)
r
O
(1)
(2)
(3)
High-level output voltage
Low-level output voltage
High-level input current
Low-level input current
Short-circuit output current
Output resistance
TEST CONDITIONS
D
OUT
at R
L
= 3 kΩ to GND,
D
OUT
at R
L
= 3 kΩ to GND,
V
I
= V
CC
V
I
at 0 V
V
CC
= 5.5 V
V
CC
, V+, and V– = 0 V
V
O
= 0 V
V
O
=
±2
V
300
D
IN
= GND
D
IN
= V
CC
MIN
5
–5
TYP
(2)
9
–9
15
–15
±10
200
–200
±60
MAX
UNIT
V
V
µA
µA
mA
Ω
Test conditions are C1–C4 = 0.1
µF
at V
CC
= 5 V
±
0.5 V.
All typical values are at V
CC
= 5 V, and T
A
= 25°C.
Short-circuit durations should be controlled to prevent exceeding the device absolute power-dissipation ratings, and not more than one
output should be shorted at a time.
Switching Characteristics
(1)
over recommended ranges of suply voltage and operating free-air temperature (unless otherwise noted) (see
PARAMETER
Maximum data rate
t
PLH(D)
t
PHL(D)
t
sk(p)
SR(tr)
(1)
(2)
(3)
Propagation delay time, low- to
high-level output
Propagation delay time, high- to
low-level output
Pulse skew
(3)
Slew rate, transition region
(see
TEST CONDITIONS
C
L
= 50 to 1000 pF,
One D
OUT
switching,
C
L
= 2500 pF,
All drivers loaded,
C
L
= 2500 pF,
All drivers loaded,
C
L
= 150 to 2500 pF,
C
L
= 50 to 1000 pF,
V
CC
= 5 V
R
L
= 3 kΩ to 7 kΩ,
See
R
L
= 3 kΩ,
See
R
L
= 3 kΩ,
See
R
L
= 3 kΩ to 7 kΩ,
See
R
L
= 3 kΩ to 7 kΩ,
3
MIN
120
2
2
300
6
30
TYP
(2)
MAX
UNIT
kbit/s
µs
µs
ns
V/µs
Test conditions are C1–C4 = 0.1
µF
at V
CC
= 5 V
±
0.5 V.
All typical values are at V
CC
= 5 V, and T
A
= 25°C.
Pulse skew is defined as |t
PLH
- t
PHL
| of each channel of the same device.
ESD Protection
PIN
D
OUT
, R
IN
Human-body model
TEST CONDITIONS
TYP
±15
UNIT
kV
4
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