LM6142, LM6144
SNOS726D –JUNE 2000–REVISED MARCH 2013
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5.0V AC Electrical Characteristics(1)
Unless Otherwise Specified, All Limits Guaranteed for TA = 25°C, V+ = 5.0V, V− = 0V, VCM = VO = V+/2 and RL > 1 MΩ to V+/2.
Boldface limits apply at the temperature extremes.
Symbol
Parameter
Conditions
Typ(2)
LM6144AI
LM6142AI
Limit(3)
LM6144BI Units
LM6142BI
Limit(3)
SR
Slew Rate
8 VPP @ V+ 12V
RS > 1 kΩ
25
17
15
13
10
6
13
11
10
6
V/μs
min
MHz
min
Deg
dB
GBW
φm
Gain-Bandwidth Product
f = 50 kHz
Phase Margin
38
Amp-to-Amp Isolation
130
en
Input-Referred
Voltage Noise
f = 1 kHz
nV
√Hz
16
in
Input-Referred
Current Noise
f = 1 kHz
pA
√Hz
0.22
T.H.D.
Total Harmonic Distortion
f = 10 kHz, RL = 10 kΩ,
0.003
%
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that TJ = TA. No guarantee of parametric performance is indicated in the electrical tables under
conditions of the internal self heating where TJ > TA.
(2) Typical values represent the most likely parametric norm.
(3) All limits are guaranteed by testing or statistical analysis.
2.7V DC Electrical Characteristics(1)
Unless Otherwise Specified, All Limits Guaranteed for TA = 25°C, V+ = 2.7V, V− = 0V, VCM = VO = V+/2 and RL > 1 MΩ to V+/2.
Boldface limits apply at the temperature extreme
Symbol
Parameter
Conditions
Typ(2)
LM6144AI
LM6142AI
Limit(3)
LM6144BI
LM6142BI
Limit(3)
Units
VOS
Input Offset Voltage
Input Bias Current
Input Offset Current
Input Resistance
0.4
150
4
1.8
4.3
250
526
30
2.5
5
mV
max
nA
IB
300
526
30
max
nA
IOS
80
80
max
MΩ
RIN
128
90
CMRR
Common Mode
Rejection Ratio
0V ≤ VCM ≤ 1.8V
0V ≤ VCM ≤ 2.7V
3V ≤ V+ ≤ 5V
dB
min
76
PSRR
VCM
Power Supply
Rejection Ratio
79
Input Common-Mode
Voltage Range
−0.25
2.95
55
0
0
V min
V max
V/mV
min
2.7
2.7
AV
VO
Large Signal
Voltage Gain
RL = 10k
Output Swing
RL = 100kΩ
0.019
2.67
0.08
0.112
2.66
0.08
0.112
2.66
V
max
V
2.25
2.25
min
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that TJ = TA. No guarantee of parametric performance is indicated in the electrical tables under
conditions of the internal self heating where TJ > TA.
(2) Typical values represent the most likely parametric norm.
(3) All limits are guaranteed by testing or statistical analysis.
4
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