SNIS159C – AUGUST 1999 – REVISED JULY 2013
ABSOLUTE MAXIMUM RATINGS
(1) (2)
MIN
Supply voltage
Output voltage
Output current
Electrostatic discharge (ESD) susceptibility
Storage temperature
(3)
MAX
35
6
10
2500
UNIT
V
V
mA
V
–0.2
–1
TO Package
TO-92 Package
TO-220 Package
SOIC-8 Package
–60
–60
–65
–65
180
150
150
150
300
260
220
215
°C
Lead temperature
TO Package (soldering, 10 seconds)
TO-92 and TO-220 Package (soldering, 10 seconds)
SOIC Package
Infrared (15 seconds)
Vapor phase (60 seconds)
–55
–40
0
°C
Specified operating temperature LM35, LM35A
range: T
MIN
to T
MAX (4)
LM35C, LM35CA
LM35D
(1)
(2)
(3)
(4)
150
110
100
°C
If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/ Distributors for availability and
specifications.
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. DC and AC electrical specifications do not
apply when operating the device beyond its rated operating conditions. See
Human body model, 100 pF discharged through a 1.5-kW resistor.
Thermal resistance of the TO-46 package is 400°C/W, junction to ambient, and 24°C/W junction to case. Thermal resistance of the TO-
92 package is 180°C/W junction to ambient. Thermal resistance of the small outline molded package is 220°C/W junction to ambient.
Thermal resistance of the TO-220 package is 90°C/W junction to ambient. For additional thermal resistance information see table in the
section.
ELECTRICAL CHARACTERISTICS
(1) (2)
LM35A
PARAMETER
TEST CONDITIONS
T
A
= 25°C
Accuracy
(5)
T
A
= –10°C
T
A
= T
MAX
T
A
= T
MIN
Nonlinearity
(6)
Sensor gain
(average slope)
Load regulation
(7)
0
≤
I
L
≤
1 mA
Line regulation
(7)
T
MIN
≤
T
A
≤
T
MAX
T
MIN
≤
T
A
≤
T
MAX
T
A
= 25°C
T
MIN
≤
T
A
≤
T
MAX
T
A
= 25°C
4 V
≤
V
S
≤
30 V
TYP
±0.2
±0.3
±0.4
±0.4
±0.18
+10
±0.4
±0.5
±0.01
±0.02
±0.05
±0.1
+9.9,
+10.1
±1
±3
±1
±1
±0.35
TESTED
LIMIT
(3)
±0.5
DESIGN
LIMIT
(4)
TYP
±0.2
±0.3
±0.4
±0.4
±0.15
+10
±0.4
±0.5
±0.01
±0.02
±0.05
±0.1
±1
±3
±1
±1.5
±0.3
+9.9,
+10.1
°C
mV/°C
mV/mA
mV/V
LM35CA
TESTED
LIMIT
(3)
±0.5
±1
°C
DESIGN
LIMIT
(4)
UNITS
(MAX.)
(1)
(2)
(3)
(4)
(5)
(6)
(7)
Unless otherwise noted, these specifications apply:
−55°C ≤
T
J
≤
150°C for the LM35 and LM35A;
−40°C ≤
T
J
≤
110°C for the LM35C
and LM35CA; and 0°C
≤
T
J
≤
100°C for the LM35D. V
S
= 5 Vdc and I
LOAD
= 50
μA,
in the circuit of
These specifications also
apply from +2°C to T
MAX
in the circuit of
Specifications in boldface apply over the full rated temperature range.
Specifications in boldface apply over the full rated temperature range.
Tested Limits are ensured and 100% tested in production.
Design Limits are ensured (but not 100% production tested) over the indicated temperature and supply voltage ranges. These limits are
not used to calculate outgoing quality levels.
Accuracy is defined as the error between the output voltage and 10 mv/°C times the case temperature of the device, at specified
conditions of voltage, current, and temperature (expressed in °C).
Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the rated
temperature range of the device.
Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating
effects can be computed by multiplying the internal dissipation by the thermal resistance.
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