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LM124MDE 参数 Datasheet PDF下载

LM124MDE图片预览
型号: LM124MDE
PDF下载: 下载PDF文件 查看货源
内容描述: LM124AQML LM124QML低功耗四路运算放大器 [LM124AQML LM124QML Low Power Quad Operational Amplifiers]
分类和应用: 运算放大器
文件页数/大小: 30 页 / 456 K
品牌: TI [ TEXAS INSTRUMENTS ]
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Note 2: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is  
functional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see the Electrical Characteristics. The guaranteed  
specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test  
conditions.  
Note 3: The maximum power dissipation must be derated at elevated temperatures and is dictated by TJmax (maximum junction temperature), ThetaJA (package  
junction to ambient thermal resistance), and TA (ambient temperature). The maximum allowable power dissipation at any temperature is PDmax = (TJmax - TA)/  
ThetaJA or the number given in the Absolute Maximum Ratings, whichever is lower.  
Note 4: Short circuits from the output to V+ can cause excessive heating and eventual destruction. When considering short circuits to ground, the maximum  
output current is approximately 40mA independent of the magnitude of V+. At values of supply voltage in excess of +15VDC, continuous short-circuits can exceed  
the power dissipation ratings and cause eventual destruction. Destructive dissipation can result from simultaneous shorts on all amplifiers.  
Note 5: This input current will only exist when the voltage at any of the input leads is driven negative. It is due to the collector-base junction of the input PNP  
transistors becoming forward biased and thereby acting as input diode clamps. In addition to this diode action, there is also lateral NPN parasitic transistor action  
on the IC chip. This transistor action can cause the output voltages of the op amps to go to the V+ voltage level (or to ground for a large overdrive) for the time  
duration that an input is driven negative. This is not destructive and normal output states will re-establish when the input voltage, which was negative, again  
returns to a value greater than -0.3VDC (at 25°C).  
Note 6: Human body model, 1.5 kΩ in series with 100 pF.  
Note 7: Guaranteed by VIO tests.  
Note 8: Datalog reading in K=V/mV  
Note 9: Guaranteed, not tested  
Note 10: Calculated parameters  
Note 11: Pre and post irradiation limits are identical to those listed under AC and DC electrical characteristics except as listed in the Post Radiation Limits Table.  
These parts may be dose rate sensitive in a space environment and demonstrate enhanced low dose rate effect. Radiation end point limits for the noted parameters  
are guaranteed only for the conditions as specified in MIL-STD-883, Method 1019  
Note 12: Low dose rate testing has been performed on a wafer-by-wafer basis, per test method 1019 condition D of MIL-STD-883, with no enhanced low dose  
rate sensitivity (ELDRS) effect.  
Note 13: The direction of the input current is out of the IC due to the PNP input stage. This current is essentially constant, independent of the state of the output  
so no loading change exists on the input lines.  
Note 14: The input common-mode voltage of either input signal voltage should not be allowed to go negative by more than 0.3V (at 25°C). The upper end of the  
common-mode voltage range is V+ −1.5V (at 25°C), but either or both inputs can go to +32V without damage independent of the magnitude of V+.  
Note 15: Due to proximity of external components, insure that coupling is not originating via stray capacitance between these external parts. This typically can  
be detected as this type of capacitance increases at higher frequencies.  
Typical Performance Characteristics  
Input Voltage Range  
Input Current  
20108034  
20108035  
www.national.com  
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