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INA285 参数 Datasheet PDF下载

INA285图片预览
型号: INA285
PDF下载: 下载PDF文件 查看货源
内容描述: 高精度宽共模范围双向电流分流监控器零漂移系列 [High-Accuracy Wide Common-Mode Range Bi-Directional CURRENT SHUNT MONITOR Zero-Drift Series]
分类和应用: 监控监视器
文件页数/大小: 31 页 / 685 K
品牌: TI [ TEXAS INSTRUMENTS ]
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INA282, INA283  
INA284, INA285  
INA286  
SBOS485A NOVEMBER 2009REVISED JULY 2010  
www.ti.com  
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with  
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.  
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more  
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.  
PACKAGE/ORDERING INFORMATION(1)  
PACKAGE  
DESIGNATOR  
PACKAGE  
MARKING  
PRODUCT  
INA282  
INA283(2)  
GAIN  
50V/V  
PACKAGE  
SOIC-8  
SOIC-8  
SOIC-8  
SOIC-8  
SOIC-8  
D
D
D
D
D
I282A  
I283A  
I284A  
I285A  
I286A  
200V/V  
500V/V  
1000V/V  
100V/V  
INA284  
INA285  
INA286  
(1) For the most current package and ordering information, see the Package Option Addendum located at the end of this data sheet, or  
refer to the device product folder at www.ti.com.  
(2) Shaded cells indicate a product preview device.  
ABSOLUTE MAXIMUM RATINGS(1)  
Over operating free-air temperature range, unless otherwise noted.  
INA282, INA283,  
INA284, INA285, INA286  
UNIT  
V
Supply Voltage  
Analog Inputs,  
+18  
(3)  
Differential (V+IN) – (V–IN  
)
–5 to +5  
V
(2)  
V+IN, V–IN  
Common-Mode  
–14 to +80  
V
Ref1, Ref2, Out  
GND–0.3 to (V+) + 0.3  
V
Input Current into Any Pin  
Storage Temperature  
Junction Temperature  
5
–65 to +150  
+150  
mA  
°C  
°C  
V
Human Body Model (HBM)  
Charged-Device Model (CDM)  
Machine Model (MM)  
3000  
ESD Ratings:  
1000  
V
200  
V
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may  
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond  
those specified is not implied.  
(2) V+IN and V–IN are the voltages at the +IN and –IN pins, respectively.  
(3) Input voltages must not exceed common-mode rating.  
THERMAL INFORMATION  
INA282AID,  
INA283AID,  
INA284AID,  
INA285AID,  
THERMAL METRIC(1)  
UNITS  
INA286AID  
D
8
qJA  
Junction-to-ambient thermal resistance  
134.9  
72.9  
61.3  
18.9  
54.3  
n/a  
qJCtop  
qJB  
Junction-to-case (top) thermal resistance  
Junction-to-board thermal resistance  
°C/W  
yJT  
Junction-to-top characterization parameter  
Junction-to-board characterization parameter  
Junction-to-case (bottom) thermal resistance  
yJB  
qJCbot  
(1) For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.  
2
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Copyright © 2009–2010, Texas Instruments Incorporated  
Product Folder Link(s): INA282 INA283 INA284 INA285 INA286  
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