欢迎访问ic37.com |
会员登录 免费注册
发布采购

DCP020505P 参数 Datasheet PDF下载

DCP020505P图片预览
型号: DCP020505P
PDF下载: 下载PDF文件 查看货源
内容描述: 微型, 2W ,隔离非稳压DC / DC转换器 [Miniature, 2W, Isolated UNREGULATED DC/DC CONVERTERS]
分类和应用: 转换器电源电路
文件页数/大小: 9 页 / 501 K
品牌: TI [ TEXAS INSTRUMENTS ]
 浏览型号DCP020505P的Datasheet PDF文件第1页浏览型号DCP020505P的Datasheet PDF文件第3页浏览型号DCP020505P的Datasheet PDF文件第4页浏览型号DCP020505P的Datasheet PDF文件第5页浏览型号DCP020505P的Datasheet PDF文件第6页浏览型号DCP020505P的Datasheet PDF文件第7页浏览型号DCP020505P的Datasheet PDF文件第8页浏览型号DCP020505P的Datasheet PDF文件第9页  
DCP02 Series  
www.ti.com  
SBVS011CMARCH 2000REVISED DECEMBER 2005  
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated  
circuits be handled with appropriate precautions. Failure to observe proper handling and installation  
procedures can cause damage.  
ESD damage can range from subtle performance degradation to complete device failure. Precision  
integrated circuits may be more susceptible to damage because very small parametric changes could  
cause the device not to meet its published specifications.  
ORDERING INFORMATION  
For the most current package and ordering information, see the Package Option Addendum at the end of this  
data sheet, or see the TI website at www.ti.com.  
Supplemental Ordering Information  
DCP02 05 05 (D)  
( )  
Basic Model Number: 2W Product  
Voltage Input:  
5V In  
Voltage Output:  
5V Out  
Dual Output:  
Package Code:  
P = DIP-14  
U = SO-28  
ABSOLUTE MAXIMUM RATINGS  
over operating free-air temperature range (unless otherwise noted)  
(1)  
DCP02 Series  
UNIT  
V
5V input models  
7
12V input models  
Input Voltage  
15  
V
15V input models  
18  
29  
V
24V input models  
V
Storage temperature range  
–60 to +125  
°C  
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings  
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating  
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
2