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5962-9317705VZC 参数 Datasheet PDF下载

5962-9317705VZC图片预览
型号: 5962-9317705VZC
PDF下载: 下载PDF文件 查看货源
内容描述: [FIFO, 16KX9, 30ns, Asynchronous, CMOS, CDFP28,]
分类和应用: 时钟先进先出芯片内存集成电路
文件页数/大小: 32 页 / 194 K
品牌: TEMIC [ TEMIC SEMICONDUCTORS ]
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3.2.5 Timing waveforms. The switching test circuit and waveforms shall be as specified on figure 4.
3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the
electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over
the full case operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The
electrical tests for each subgroup are defined in table I. Unless otherwise specified, the values specified in table I are the
preirradiation and postirradiation values. Postirradiation electrical measurements for any RHA level are tested at, T
A
=
+25°C.
3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also
be marked as listed in MIL-HDBK-103. For packages where marking of the entire SMD PIN number is not feasible due to
space limitations, the manufacturer has the option of not marking the "5962-" on the device. For RHA product using this
option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-
PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A.
3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as
required in MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535,
appendix A.
3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a
QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class
M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply
in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved
source of supply for this drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the
requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and
herein.
3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535
or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this
drawing.
3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see
6.2 herein) involving devices acquired to this drawing is required for any change as defined in MIL-PRF-38535 appendix A.
3.9 Verification and review for device class M. For device class M, DSCC, DSCC's agent, and the acquiring activity
retain the option to review the manufacturer's facility and applicable required documentation. Offshore documentation
shall be made available onshore at the option of the reviewer.
3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in
microcircuit group number 105 (see MIL-PRF-38535, appendix A).
4. QUALITY ASSURANCE PROVISIONS
4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance
with MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the
QM plan shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection
procedures shall be in accordance with MIL-PRF-38535, appendix A.
4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be
conducted on all devices prior to qualification and technology conformance inspection. For device class M, screening
shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality
conformance inspection.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
SIZE
A
REVISION LEVEL
D
5962-93177
SHEET
5
DSCC FORM 2234
APR 97