3.7 Certificate of conformance. A certificate of conformance as required in MIL-STD-883 (see 3.1 herein) shall be
provided with each lot of microcircuits delivered to this drawing.
3.8 Notification of change. Notification of change to DESC-ECC shall be required in accordance with MIL-STD-883
(see 3.1 herein).
3.9 Verification and review. DESC, DESC's agent, and the acquiring activity retain the option to review the
manufacturer's facility and applicable required documentation. Offshore documentation shall be made available onshore
at the option of the reviewer.
4. QUALITY ASSURANCE PROVISIONS
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with section 4 of
MIL-M-38510 to the extent specified in MIL-STD-883 (see 3.1 herein).
4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all
devices prior to quality conformance inspection. The following additional criteria shall apply:
a. Burn-in test, method 1015 of MIL-STD-883.
(1) Test condition A, B, C, or D using the circuit submitted with the certificate of compliance (see 3.6 herein).
(2) T = +125 C, minimum.
A
b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical
parameter tests prior to burn-in are optional at the discretion of the manufacturer.
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of
MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
4.3.1 Group A inspection.
a. Tests shall be as specified in table II herein.
b. Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted.
c. Subgroup 4 (C and C
IN
measurements) shall be measured only for the initial test and after process or design
OUT
changes which may affect input capacitance. Sample size is 15 devices with no failures, and all input
and output terminals tested.
d. Subgroups 7 and 8 shall include verification of the truth table.
4.3.2 Groups C and D inspections.
a. End-point electrical parameters shall be as specified in table II herein.
b. Steady-state life test conditions, method 1005 of MIL-STD-883.
(1) Test condition D or E using the circuit submitted with the certificate of compliance (see 3.6 herein).
(2) T = +125 C, minimum.
A
(3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
SIZE
STANDARDIZED
5962-89863
A
MILITARY DRAWING
DEFENSE ELECTRONICS SUPPLY CENTER
DAYTON, OHIO 45444
REVISION LEVEL
SHEET
19
DESC FORM 193A
SEP 87
TEMIC [ TEMIC SEMICONDUCTORS ]
