TABLE I. Electrical performance characteristics Continued.
Test
Symbol
Conditions
-55 C +125 C
= 0 V; 4.5 V 5.5 V
unless otherwise specified
Group A
subgroups
Device
types
Limits
Max
Unit
T
C
V
V
CC
Min
SS
Functional tests
Read cycle time
4/
See 4.4.1c
7, 8A, 8B
7 1/
All
M,D,P
See figure 4, as applicable 5/ 6/
2/
2/
t
9, 10, 11
01,05,
13,22,30
120
ns
ns
AVAV
02,06,
14,23,31
100
03,07,15,
24,32
85
70
04,08,16,
25,33,42,
43
09,17,
26,34
55
45
35
10,18,
27,35
11,19,
28,36
47
30
25
12,20,
29,37
21,38-40
41,44
45,46
All
20
15
12
2/
M,D,P
9 1/
See footnotes at end of table.
SIZE
STANDARD
5962-89598
A
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
L
SHEET
10
DSCC FORM 2234
APR 97
TEMIC [ TEMIC SEMICONDUCTORS ]
