TABLE I. Electrical performance characteristics Continued.
Test
Symbol
Conditions
-55 C +125 C
= 0 V; 4.5 V 5.5 V
unless otherwise specified
Group A
subgroups
Device
types
Limits
Max
Unit
ns
T
C
Min
V
V
CC
SS
Chip enable access
time
t
See figure 4, as applicable
9, 10, 11
01,05,
13,22,30
120
100
85
ELQV
02,06,
14,23,31
03,07,
15,24,32
04,08,
70
16,25,
33,42,43
09,17,
26,34
55
45
35
10,18,
27,35
11,19,
28,36
47
30
25
12,20,
29,37
21,38-40
41,44
45,46
All
20
15
12
2/
M,D,P
9 1/
See footnotes at end of table.
SIZE
STANDARD
5962-89598
A
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
L
SHEET
12
DSCC FORM 2234
APR 97
TEMIC [ TEMIC SEMICONDUCTORS ]
