TABLE I. Electrical performance characteristics Continued.
Test
Symbol
Group A
subgroups
Device
type
Limits
Unit
Conditions
-55°C ≤ T ≤ +125°C
C
Min
Max
VSS = 0 V
4.5 V ≤ V ≤ 5.5 V
CC
unless otherwise specified
01
140
100
85
Read high to half-full
flag high
tRHF
CL = 30 pF,
See figures 4 and 5
9,10,11
02
ns
03
04
65
05
50
06
40
07,08
30
M, D
9 1/
2/
01
02
03
04
05
06
07
08
120
80
65
50
40
30
20
15
tWPF
CL = 30 pF,
See figures 4 and 5
9,10,11
ns
Write pulse width after
FF high
M, D
9 1/
2/
1/ When performing postirradiation electrical measurements for any RHA level TA = +25°C. Limits shown are guaranteed
at TA = +25°C. The M and D in the test condition column are the postirradiation limits for the device types specified in the
device types column.
2 Preirradiation values for RHA marked devices shall also be the postirradiation values, unless otherwise specified.
3/ If not tested, shall be guaranteed to the limits specified in table I.
4/ Only applies to read data flow through mode.
SIZE
STANDARD
5962-89568
MICROCIRCUIT DRAWING
A
REVISION LEVEL
H
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
15
DSCC FORM 2234
APR 97
TEMIC [ TEMIC SEMICONDUCTORS ]
