TABLE I. Electrical performance characteristics Continued.
Test
Symbol
Conditions
Group A
subgroups
Device
type
Limits
Unit
-55°C ≤ T ≤ +125°C
C
VSS = 0 V
Min
Max
4.5 V ≤ V
≤ 5.5 V
CC
unless otherwise specified
01
35
CL = 30 pF,
See figures 4 and 5
9,10,11
02-04
05
30
25
20
15
Read pulse high to
data bus high Z
tRHZ
3/
ns
06
07,08
M, D
9 1/
2/
01
02
03
04
05
06
07
08
140
100
80
Write cycle time
tWC
CL = 30 pF,
See figures 4 and 5
9,10,11
ns
65
50
40
30
25
M, D
9 1/
2/
01
02
03
04
05
06
07
08
120
80
65
50
40
30
20
15
tWPW
CL = 30 pF,
See figures 4 and 5
9,10,11
Write pulse width
ns
M, D
9 1/
2/
01-02
03-04
20
15
Write recovery time
tWR
CL = 30 pF,
9,10,11
See figures 4 and 5
ns
ns
05-08
10
M, D
9 1/
2/
01,02
03,04
05
40
30
20
18
12
9
tDS
CL = 30 pF,
See figures 4 and 5
9,10,11
Data setup time
06
07
08
M, D
9 1/
2/
See footnotes at end of table.
SIZE
STANDARD
5962-89568
MICROCIRCUIT DRAWING
A
REVISION LEVEL
H
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
9
DSCC FORM 2234
APR 97
TEMIC [ TEMIC SEMICONDUCTORS ]
