TABLE I. Electrical performance characteristics - Continued.
│
│
│
│
│
│
│
│
│
│
│
│
│
Conditions 1/
-55°C < TC < +125°C
4.5 V < VCC < 5.5 V
│ Limits
│
│ Min │ Max
Test
│Symbol
│
│Group A │ Device
│subgroups │ types
│
│ Unit
│
│
│ unless otherwise specified
│
│
│
│
│
│
│
│
│
│
│
│
│
│
│
│
│
│
│
│
│
│
│
│
│
│
│
│
│
│
│
│
Expansion out high
delay from clock
│tXOH 5/
│9, 10, 11 │ 01
│ 80
│
│ 65
│
│ 50
│
│ 40
│
│ ns
│
│
│
│
│
│
│
│
│
│
│
│
│
│
│
│
│
│
│
│
│
│
│
│
│
│
│ 02
│
│ 03
│
│ 04
│
│ 05
│
│ 30
│
│
│
│
│
│
│ 06
│
│ 20
│
│
│
│
│
│
│
│
│
│
│
│ 07
│
│ 25
│
1/ AC tests are performed with input rise and fall times of 5 ns or less, timing reference levels of 1.5 V, input pulse levels of 0 to
3.0 V, and the output load circuit, unless otherwise specified. See figures 4 and 5.
2/ These are absolute values with respect to device ground and all overshoots due to system or tester noise are included.
3/ VIH is 2.2 V minimum for all input pins except XI, which is 3.5 V minimum.
4/ May not be tested, but shall be guaranteed to the limits specified in table I herein.
5/ Tested initially and after any design or process changes that affect that parameter, and therefore shall be guaranteed to the
limits specified in table I.
6/ Transition is measured at steady-state high level -500 mV or steady-state low level +500 mV on the output from the 1.5 V
level on the input.
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are
as specified in Table I and shall apply over the full case operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
tests for each subgroup are described in Table I.
3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed
in 1.2 herein. In addition, the manufacturer's PIN may also be marked. For packages where marking of the entire SMD PIN
number is not feasible due to space limitations, the manufacturer has the option of not marking the "5962-" on the device.
3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance
to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a "Q" or "QML" certification mark in
accordance with MIL-PRF-38535 to identify when the QML flow option is used.
3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an
approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to
listing as an approved source of supply shall affirm that the manufacturer's product meets the requirements of MIL-PRF-38535,
appendix A and the requirements herein.
3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided
with each lot of microcircuits delivered to this drawing.
3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing.
3.9 Verification and review. DSCC, DSCC's agent, and the acquiring activity retain the option to review the manufacturer's
facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the
reviewer.
SIZE
STANDARD
5962-88669
A
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
E
SHEET
12
DSCC FORM 2234
APR 97
TEMIC [ TEMIC SEMICONDUCTORS ]
