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BT136X-600D 参数 Datasheet PDF下载

BT136X-600D图片预览
型号: BT136X-600D
PDF下载: 下载PDF文件 查看货源
内容描述: 晶闸管产品目录 [Thyristor Product Catalog]
分类和应用: 栅极三端双向交流开关局域网
文件页数/大小: 224 页 / 2673 K
品牌: TECCOR [ TECCOR ELECTRONICS ]
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Quality and Reliability  
Reliability Stress Tests  
The following table contains brief descriptions of the reliability tests commonly used in evaluating Teccor product reliability on a peri-  
odic basis. These tests are applied across product lines depending on product availability and test equipment capacities. Other tests  
may be performed when appropriate.  
Test Type  
Typical Conditions  
Test Description  
Standards  
T = 100 °C to 150 °C, Bias @  
Evaluation of the reliability of  
product under bias conditions  
and elevated temperature  
MIL-STD-750, M-1040  
High Temperature  
A
AC Blocking  
100%  
Rated VDRM, t = 24 hrs to 1000 hrs  
TA = 150 °C, t = 250 to 1000 hrs Evaluation of the effects on  
devices after long periods of  
MIL-STD-750, M-1031  
High Temperature  
Storage Life  
storage at high temperature  
TA = 85 °C to 95 °C, rh = 85% to Evaluation of the reliability of non- EIA / JEDEC, JESD22-A101  
Temperature and Humidity  
Bias Life  
hermetic packaged devices in  
95%  
humid environments  
Bias @ 80% Rated V  
(320 VDC max)  
DRM  
t = 168 to 1008 hrs  
TA = -65 °C to 150 °C,  
cycles = 10 to 500  
Evaluation of the device’s ability MIL-STD-750, M-1051,  
Temperature Cycle  
[Air to Air]  
to withstand the exposure to  
extreme temperatures and the  
forces of TCE during transitions  
between temperatures  
EIA / JEDEC, JESD22-A104  
TA = 0 °C to 100 °C, ttxfr = 10 s, Evaluation of the device’s ability MIL-STD-750, M-1056  
Thermal Shock  
to withstand the sudden changes  
cycled = 10 to 20  
[Liquid to Liquid]  
in temperature and exposure to  
extreme temperatures  
TA = 121 °C, rh = 100%, P = 15 psig, Accelerated environmental test to EIA / JEDEC, JESD22-A102  
Autoclave  
evaluate the moisture resistance  
t = 24 hrs to 168 hrs  
of plastic packages  
TA = 260 °C, t = 10 s  
Evaluation of the device’s ability MIL-STD-750, M-2031  
to withstand the temperatures as  
seen in wave soldering  
Resistance to  
Solder Heat  
operations  
Steam aging = 1 hr to 8 hrs,  
Evaluation of the solderability of MIL-STD-750, M-2026,  
Solderability  
T
= 245 °C, Flux = R  
device terminals after an  
extended period  
ANSI-J-STD-002  
solder  
Flammability Test  
For the UL 94V0 flammability test, all expoxies used in Teccor encapsulated devices are recognized by Underwriters Laboratories  
©2002 Teccor Electronics  
Thyristor Product Catalog  
P - 9  
http://www.teccor.com  
+1 972-580-7777  
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