TSL4531
DIGITAL AMBIENT LIGHT SENSOR
TAOS112 − OCTOBER 2011
Operating Characteristics, V
DD
= 2.5 V, T
A
= 255C (unless otherwise noted)
PARAMETER
I
DD
I
LEAK
V
IH
V
IL
Supply current
Leakage current, SDA and SCL pins
TSL45311, TSL45315
SCL,
SCL SDA input high voltage
SCL,
SCL SDA input low voltage
TSL45313, TSL45317
TSL45311, TSL45315
TSL45313, TSL45317
NOTE 1: The average supply current will be slightly lower when PSAVESKIP = 0.
TEST CONDITIONS
Active (Note 1)
Power down — no I
2
C activity
−5
0.7 V
DD
1.25
0.3 V
DD
0.54
MIN
TYP
110
2.2
MAX
130
4
5
UNIT
μA
μA
V
V
ALS Characteristics, V
DD
= 2.5 V, T
A
= 255C, TCNTRL = 1y (Tint = 400 ms) (unless otherwise noted)
PARAMETER
ADC count value
λ
p
= white LED, CCT = 4000K, E
V
= 1000 lux
ADC count value
ADC count value ratio
Sensor output responsivity
Dynamic range
Temperature coefficient
λ
p
= 880 nm + 940 nm, E
e
= 345
μW/cm
2
(Note 1)
Inc std A/Fluorescent F12 (Notes 2 & 4)
λ
p
= white LED, CCT = 4000K
Incandescent light source: STD A
(Notes 3 & 4)
−15°C to 0°C
0°C to 70°C
TCNTRL = 10
Integration time
TCNTRL = 01
TCNTRL = 00
TCNTRL = 10, PSAVESKIP = 0 (Note 5)
Total cycle time
TCNTRL = 01, PSAVESKIP = 0 (Note 5)
TCNTRL = 00, PSAVESKIP = 0 (Note 5)
NOTES: 1.
2.
3.
4.
5.
80
0.8
3
−0.25
−0.20
96
192
384
110.4
220.8
441.6
100
200
400
115
230
460
1
TEST CONDITIONS
MIN
0
1000
3
120
1.2
220k
0
0
104
208
416
119.6
239.2
478.4
ms
ms
counts
%
count/lux
lux
% /
°C
TYP
MAX
65535
UNIT
counts
Combination of IR LEDs used with peak wavelengths of 880 nm and 940 nm for IR rejection production test.
Incandescent STD A light source at 300 lux. Fluorescent F12 light source at 300 lux.
220,000 lux reading possible with TCNTRL set to 4
×
MULTIPLIER (Tint = 100 ms).
Not tested in production.
When PSAVESKIP = 1, total cycle time equals integration time.
The
LUMENOLOGY
r
Company
r
r
www.taosinc.com
Copyright
E
2011, TAOS Inc.
3
TAOS [ TEXAS ADVANCED OPTOELECTRONIC SOLUTIONS ]
