SLAS687A – FEBRUARY 2013 – REVISED FEBRUARY 2013
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
AINR
AINL
0 dB to -78 dB and Mute
(Min 0.5 dB steps)
0 dB to -78 dB
and Mute
(Min 0.5 dB steps)
6 dB to +24 dB
(6 dB steps)
DAC Signal
Proc.
Dig
Vol
Mono
6
'
DAC
6
-6 dB to +29 dB
and Mute
(1 dB steps)
SPKP
SPKM
miniDSP
0 dB to -78 dB
and Mute
(Min 0.5 dB steps)
6
POR
HPOUT
Data
Interface
LDO
LDO_SEL
SPKVDD
SPI_SEL
RST
SPI/I
2
C
Control Block
Secondary I
2
S
Interface
Primary I
2
S
Interface
AVDD
Supplies
PLL
Interrupt
Control
DVDD
IOVDD
SPKVSS
AVSS
DVSS
Pin Muxing / Clock Routing
SDA/MOSI
GPIO/DOUT
SCL/SSZ
SCLK
MISO
WCLK
Figure 1-1. Simplified Block Diagram
NOTE
This data manual is designed using PDF document-viewing features that allow quick access
to information. For example, performing a global search on "page 0 / register 27" produces
all references to this page and register in a list. This makes is easy to traverse the list and
find all information related to a page and register. Note that the search string must be of the
indicated format. Also, this document includes document hyperlinks to allow the user to
quickly find a document reference. To come back to the original page, click the green left
arrow near the PDF page number at the bottom of the file. The hot-key for this function is alt-
left arrow on the keyboard. Another way to find information quickly is to use the PDF
bookmarks.
2
INTRODUCTION
Product Folder Links:
MCLK
BCLK
DIN
Copyright © 2013, Texas Instruments Incorporated
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