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LB2012T1R0M 参数 Datasheet PDF下载

LB2012T1R0M图片预览
型号: LB2012T1R0M
PDF下载: 下载PDF文件 查看货源
内容描述: 绕线贴片电感 [WOUND CHIP INDUCTORS]
分类和应用:
文件页数/大小: 47 页 / 2184 K
品牌: TAIYO YUDEN [ TAIYO YUDEN (U.S.A.), INC ]
 浏览型号LB2012T1R0M的Datasheet PDF文件第14页浏览型号LB2012T1R0M的Datasheet PDF文件第15页浏览型号LB2012T1R0M的Datasheet PDF文件第16页浏览型号LB2012T1R0M的Datasheet PDF文件第17页浏览型号LB2012T1R0M的Datasheet PDF文件第19页浏览型号LB2012T1R0M的Datasheet PDF文件第20页浏览型号LB2012T1R0M的Datasheet PDF文件第21页浏览型号LB2012T1R0M的Datasheet PDF文件第22页  
RELIABILITY DATA  
12.Adhesion of terminal electrode  
LEM2520  
LB3218  
LB2518  
LB2016  
LB2012  
LB1608  
LBMF1608  
LBC3225  
LBR2518  
CB2518  
LBC2518  
LBR2012  
CB2016  
CBC2518  
LBC2016  
LBC2012  
CB2012  
No abnormality.  
CBC3225  
CBL2012  
CBMF1608  
LBM2016  
CBC2016  
CBC2012  
Test Methods and Remarks】  
LBLBCLBRCBCBCCBLLBMLBMFCBMFLEM2520Applied force10N to X and Y directions  
Duration5 sec.  
Test substratePrinted board  
LB1608CBMF1608LBMF1608  
Applied force5N to X and Y directions  
Duration5 sec.  
Test substratePrinted board  
13.Resistance to vibration  
LEM2520  
Inductance change:Within±5%  
No significant abnormality in appearance.  
No significant abnormality in appearance.  
No significant abnormality in appearance.  
LB3218  
LB2518  
LB2016  
LB2012  
LB1608  
LBMF1608  
LBC3225  
LBR2518  
CB2518  
LBC2518  
LBR2012  
CB2016  
CBC2518  
LBC2016  
LBC2012  
CB2012  
Inductance change:Within±10%  
CBC3225  
CBL2012  
CBMF1608  
LBM2016  
CBC2016  
CBC2012  
Inductance change:Within±5%  
Test Methods and Remarks】  
LEMLBLBCLBRCBCBCCBLLBMLBMFCBMFAccording to JIS C5102 clause 8.2.  
Vibration typeA  
Directions2 hrs each in X, Y and Z directions. Total6 hrs  
Frequency range10 to 55 to 10 Hz1min.)  
Amplitude1.5mm  
Mounting methodSoldering onto printed board  
RecoveryAt least 2 hrs of recovery under the standard condition after the test, followed by the measurement within 48 hrs.  
LEMRecovery  
At least 1 hr of recovery under the standard condition after the test, followed by the measurement within 2 hrs.  
14.Drop test  
LEM2520  
LB3218  
Inductance change:Within±5%  
No significant abnormality in appearance.  
LB2518  
LB2016  
LB2012  
LB1608  
LBMF1608  
LBC3225  
LBR2518  
CB2518  
LBC2518  
LBR2012  
CB2016  
CBC2518  
LBC2016  
LBC2012  
CB2012  
CBC3225  
CBL2012  
CBMF1608  
LBM2016  
CBC2016  
CBC2012  
Test Methods and Remarks】  
LEM:  
Acceleration980m/sec2  
Duration6msec  
Number of times6 sides×3 times  
Mounting methodSoldering onto printed board  
RecoveryAt least 2 hrs of recovery under the standard condition after the test, followed by the measurement within 48 hrs.  
LEMRecovery  
At least 1 hr of recovery under the standard condition after the test, followed by the measurement within 2 hrs.  
15.Solderability  
LEM2520  
LB3218  
LB2518  
LB2016  
LB2012  
LB1608  
LBMF1608  
LBC3225  
LBR2518  
CB2518  
LBC2518  
LBR2012  
CB2016  
CBC2518  
LBC2016  
LBC2012  
CB2012  
At least 90of surface of terminal electrode is covered by new  
CBC3225  
CBL2012  
CBMF1608  
LBM2016  
CBC2016  
CBC2012  
Test Methods and Remarks】  
LEM:  
Solder temperature230±5℃  
Duration5±0.5sec.  
FluxMethanol solution with 25of colophony  
LBLBCLBRCBCBCCBLLBMLBMFCBMFSolder temperature245±5℃  
Duration5±0.5sec  
FluxMethanol solution with 25of colophony  
This catalog contains the typical specification only due to the limitation of space. When you consider purchase of our products, please check our specification.  
For details of each product (characteristics graph, reliability information, precautions for use, and so on), see our Web site (http://www.ty-top.com/) or CD catalogs.  
wound0103_reli_e-01  
wound0103_reli-PRP4  
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