Electrical specifications
Table 12. Electrical transient requirements
VN5010AK-E
Test levels (1)
ISO 7637-2:
2004(E)
Number of
pulses or
test times
Burst cycle/pulse
repetition time
Delays and
impedance
III
IV
Test pulse
1
-75V
+37V
-100V
+75V
-6V
-100V
+50V
-150V
+100V
-7V
5000 pulses
5000 pulses
1h
0.5 s
0.2 s
5 s
2 ms, 10 Ω
50 µs, 2 Ω
2a
3a
5 s
90 ms
90 ms
100 ms
100 ms
0.1 µs, 50 Ω
0.1 µs, 50 Ω
100 ms, 0.01Ω
400 ms, 2 Ω
3b
1h
4
1 pulse
1 pulse
5b (2)
+65V
+87V
Test level results(1)
ISO 7637-2:
2004(E)
III
C
C
C
C
C
C
IV
C
C
C
C
C
C
Test pulse
1
2a
3a
3b
4
5b (2)
1. The above test levels must be considered referred to VCC = 13.5V except for pulse 5b.
2. Valid in case of external load dump clamp: 40V maximum referred to ground.
Class
Contents
C
All functions of the device are performed as designed after exposure to disturbance.
One or more functions of the device are not performed as designed after exposure to
disturbance and cannot be returned to proper operation without replacing the device.
E
16/31
STMICROELECTRONICS [ ST ]
